Die folgenden Begriffe wurden einbezogen:
"electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性
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2018,
Buesink F, Vout-Ardatjew R, Leferink L
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 918-921; ISBN 978-1-4673-9699-8
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2018,
De Miguel-Bilbao S, Blas J, Falcone F, Ramos V
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 510-514; ISBN 978-1-4673-9699-8
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2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: S. 28-31; ISBN 978-1-5090-3955-5
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2018,
Sato K, Tsukahara T, Kamimura Y
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 506-509; ISBN 978-1-4673-9699-8
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2018,
Kamimura Y, Inagaki S, Wake K
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 855-859; ISBN 978-1-4673-9699-8
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2018,
Piper S, Ball L, Mandziuk M
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: S. 448-453; ISBN 978-1-5386-6622-7
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2018,
Bejenaru O, Lazarescu C, Vornicu S, David V
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 1004-1009; ISBN 978-1-5386-5063-9
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2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: S. 959-962; ISBN 978-1-5090-3955-5
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2018,
Kim JH, Kim H, Nam S
2018 International Symposium on Antennas and Propagation (ISAP), Busan, Korea (South). IEEE: S. 1-2; ISBN 978-1-5386-5389-0
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2018,
Houran MA, Yang X, Chen W, Samizadeh M
2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia), Niigata, Japan. IEEE: S. 1062-1066; ISBN 978-1-5386-4190-3
