Die folgenden Begriffe wurden einbezogen:
"electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性
-
2018,
Kaschel H, Ahumada C
2018 IEEE International Conference on Automation/XXIII Congress of the Chilean Association of Automatic Control (ICA-ACCA), Concepcion, Chile. IEEE: S. 1-8; ISBN 978-1-5386-5587-0
-
2018,
Kaschel H, Ahumada C
2018 IEEE International Conference on Automation/XXIII Congress of the Chilean Association of Automatic Control (ICA-ACCA), Concepcion, Chile. IEEE: S. 1-6; ISBN 978-1-5386-5587-0
-
2018,
Ardeleanu ME, Nicoleanu P, Stanescu DG, Pisleag D
2018 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE: S. 1-6; ISBN 978-1-5386-3807-1
-
2018,
Aga K, Hirata A, Laakso I
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 515-520; ISBN 978-1-4673-9699-8
-
2018,
Karpowicz J, De Miguel-Bilbao S, Zradzńnski P, Gryz K, Falcone F, Ramos V
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 972-975; ISBN 978-1-4673-9699-8
-
2018,
Isrie S, Moonen N, Schipper H, Bergsma H, Lefcrink F
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 500-505; ISBN 978-1-4673-9699-8
-
2018,
Feliziani M, Campi T, Cruciani S, De Santis V
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 155-160; ISBN 978-1-4673-9699-8
-
2018,
Buesink F, Vout-Ardatjew R, Leferink L
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 918-921; ISBN 978-1-4673-9699-8
-
2018,
De Miguel-Bilbao S, Blas J, Falcone F, Ramos V
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 510-514; ISBN 978-1-4673-9699-8
-
2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: S. 28-31; ISBN 978-1-5090-3955-5
