Die folgenden Begriffe wurden einbezogen:
"electrical injury", "elektrischer Schlag", Elektrounfall, Stromschlag, Stromunfall, "electric shock", 電撃傷
-
2019,
Boyd AN, Hartman BC, Sood R, Walroth TA
Burns 45 (4): 869-875
-
2019,
Steward L, Wagner AL, Neumann R, Wiktor AJ
J Burn Care Res 40 (4): 517-519
-
2019,
Uzel Şener M, Demir A, Şener A
Ulus Travma Acil Cerrahi Derg 25 (2): 198-201
-
Asian J Surg 42 (2): 474-476
-
2019,
Kroll MW, Ritter MB, Perkins PE, Shams L, Andrews CJ
J Emerg Med 56 (5): e71-e79
-
2019,
Pilecky D, Vamos M, Bogyi P, Muk B, Stauder D, Racz H, Nyolczas N, Duray GZ, Zacher G, Zima E
Clin Res Cardiol 108 (8): 901-908
-
2019,
Daskal Y, Beicker A, Dudkiewicz M, Kessel B
Harefuah 158 (1): 65-69
-
2019,
Peters S, Visser AE, D'Ovidio F, Beghi E, Chiò A, Logroscino G, Hardiman O, Kromhout H, Huss A, Veldink J, Vermeulen R, van den Berg LH
Am J Epidemiol 188 (4): 796-805
-
Forensic Sci Med Pathol 15 (4): 635-637
-
Acta Paediatr 108 (3): 574
-
2019,
Getzmann JM, Slankamenac K, Sprengel K, Mannil L, Giovanoli P, Plock JA
J Plast Reconstr Aesthet Surg 72 (3): 438-446
-
2019,
Andrews C, Cooper MA
Acta Paediatr 108 (3): 573
-
2019,
Carrougher GJ, McMullen K, Mandell SP, Amtmann D, Kowalske KJ, Schneider JC, Herndon DN, Gibran NS
J Burn Care Res 40 (1): 21-28
-
2019,
Tapking C, Hundeshagen G, Popp D, Lee JO, Herndon DN, Zapata-Sirvent R, Branski LK
J Burn Care Res 40 (1): 107-111
-
2019,
Lee DH, Desai MJ, Gauger EM
J Am Acad Orthop Surg 27 (1): e1-e8
-
2019,
Honnegowda TM, Kumar P, Udupa P, Rao P
Int Wound J 16 (1): 79-83
-
2019,
Chen H, Chen Z, Wang J, Tian P, Shen YM, Huang L, Hu XH
J Burn Care Res 40 (1): 128-132
-
2019,
Maxwell JR, Kamm C, Grassham CD, Fuller J, Lowe JR, Ianus V
Acta Paediatr 108 (3): 557-558
-
2019,
Reinbold C, Serror K, Mimoun M, Chaouat M, Marco O, Boccara D
J Burn Care Res 40 (1): 120-127
-
2019,
Prezelj N, Trošt M, Georgiev D, Flisar D
J Neurosurg 130 (3): 763-765
-
2019,
Tashiro J, Burnweit CA
Pediatr Emerg Care 35 (4): 261-264
-
2018,
Wu X, Meisner DJ, Stechschulte KD, Simha V, Wellman RJ, Thakur M, Posey KR
2018 IEEE Industry Applications Society Annual Meeting (IAS), Portland, OR, USA. IEEE: S. 1-8; ISBN 978-1-5386-4537-6
-
2018,
Kono M, Takahashi T, Nakamura H, Miyaki T, Rekimoto J
ACM Trans Comput Hum Interact 25 (3): 19
-
Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN VDE 0100-410 VDE 0100-410:2018-10
-
2018 IEEE Petroleum and Chemical Industry Technical Conference (PCIC), Cincinnati, OH, USA. IEEE: S. 463-472; ISBN 978-1-5386-4271-9
