Die folgenden Begriffe wurden einbezogen:
"electric field", "Elektrisches Feld", EF, 電界
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2020,
Urabe G, Sato T, Nakamura G, Kobashigawa Y, Morioka H, Katsuki S
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2020,
Psenakova Z, Benova M, Mydlova J
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Online-Konferenz. IEEE: S. 1-4; ISBN 978-1-7281-9618-3
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2020,
Tognola G, Masini B, Gallucci S, Bonato M, Fiocchi S, Chiaramello E, Dossi L, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5690-3
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2020,
Bereta M, Teplan M, Chafai DE, Cifra M
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-3; ISBN 978-1-7281-5690-3
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2020,
Koponen LM, Stenroos M, Nieminen JO, Jokivarsi K, Gröhn O, Ilmoniemi RJ
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2020,
Voloshin T, Schneiderman RS, Volodin A, Shamir RR, Kaynan N, Zeevi E, Koren L, Klein-Goldberg A, Paz R, Giladi M, Bomzon Z, Weinberg U, Palti Y
Cancers 12 (10): E3016
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2020,
Migdał P, Murawska A, Strachecka A, Bieńkowski P, Roman A
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2020,
Ren HC, Ji LX, Chen TN, Yuan JN, Huang YY, Wei DQ, Ji GF, Zhang ZM
J Phys Chem B 124 (43): 9570-9578
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2020,
Djekidel R, Bessedik SA, Akef S
IET Sci Meas Technol 14 (8): 914-923
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2020,
Samaniego J, Chuchon M, Adriano R, Inca S
2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON), Lima, Peru. IEEE: S. 1-4; ISBN 978-1-7281-9378-6
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2020,
Brenner B, Majano D
2020 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: S. 1-5; ISBN 978-1-7281-6439-7
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2020,
Carter CS, Huang SC, Searby CC, Cassaidy B, Miller MJ, Grzesik WJ, Piorczynski TB, Pak TK, Walsh SA, Acevedo M, Zhang Q, Mapuskar KA, Milne GL, Hinton Jr AO, Guo DF, Weiss R, Bradberry K, Taylor EB, Rauckhorst AJ, Dick DW, Akurathi V, Falls-Hubert KC, Wagner BA, Carter WA, Wang K, Norris AW, Rahmouni K, Buettner GR, Hansen JM, Spitz DR, Abel ED, Sheffield VC
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2020,
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2020 International Conference on Technology and Entrepreneurship (ICTE), Bologna, Italy. IEEE: S. 1-6; ISBN 978-1-7281-4903-5
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2020,
Buyakova NV, Kryukov AV, Seredkin DA
2020 International Ural Conference on Electrical Power Engineering (UralCon), Chelyabinsk, Russia. IEEE: S. 76-81; ISBN 978-1-7281-6210-2
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2020,
Sorkhabi MM, Wendt K, Denison T
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Montreal, QC, Canada. IEEE: S. 3537-3543; ISBN 978-1-7281-1991-5
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2020,
Hisatake S, Kamada J, Asano Y, Uchida H, Tojo M, Oikawa Y, Miyaji K
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2020,
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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Montreal, QC, Canada. IEEE: S. 5326-5329; ISBN 978-1-7281-1991-5
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2020,
Zhou Y, Zhang X, Li H
2020 IEEE International Conference on Advances in Electrical Engineering and Computer Applications( AEECA), Dalian, China. IEEE: S. 567-571; ISBN 978-1-7281-6522-6
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2020,
Dasdag O, Adalier N, Dasdag S
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2020,
Sahm F, Ziebart J, Jonitz-Heincke A, Hansmann D, Dauben T, Bader R
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2020,
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2020,
Guido I, Diehl D, Olszok NA, Bodenschatz E
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2020,
Oh JY, Lee YJ, Kim EH
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