Die folgenden Begriffe wurden einbezogen:
"electric field", "Elektrisches Feld", EF, 電界
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.122 (12/2016): 1-70
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2016,
Korpinen L, Pääkkönen R, Farrugia L, Tarao H, Gobba F
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: S. 2106-2108; ISBN 978-1-5090-6094-8
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2016,
Karpowicz J, Bienkowski P, Kieliszek J
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: S. 668-671; ISBN 978-1-5090-1417-0
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2016,
Koppel T, Haldre H, Shishkin A, Hussainova I, Toropovs N, Mironovs V, Tint P
2016 57th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia. IEEE: S. 1-6; ISBN 978-1-5090-3732-2
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2016,
Kusuma AA, Pramana PAA, Munir BS
2016 International Conference on Smart Green Technology in Electrical and Information Systems (ICSGTEIS), Bali, Indonesia. IEEE: S. 33-37; ISBN 978-1-5090-2691-3
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2016,
Kundacina O, Vincan V, Antic D, Kljajic D, Kasas-Lazetic K
2016 24th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: S. 1-4; ISBN 978-1-5090-4087-2
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2016,
Karpowicz J, Kieliszek J, Sobiech J, Gryz K, Puta R
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: S. 760-764; ISBN 978-1-5090-1417-0
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2016,
Nedic G, Djuric N, Kljajic D, Milutinov M, Josic S
2016 24th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: S. 1-4; ISBN 978-1-5090-4087-2
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2016,
Purcar M, Munteanu C, Avram A, Miron F
2016 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE: S. 1-5; ISBN 978-1-4673-8562-6
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2016,
Lewicki F, Lugowski A, Zagorda G
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: S. 480-484; ISBN 978-1-5090-1417-0
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2016 IEEE/ACES International Conference on Wireless Information Technology and Systems (ICWITS) and Applied Computational Electromagnetics (ACES), Honolulu, HI, USA. IEEE: S. 1-4; ISBN 978-1-5090-1259-6
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2016 17th International Conference Computational Problems of Electrical Engineering (CPEE), Sandomierz, Poland. IEEE: S. 1-4; ISBN 978-1-5090-2801-6
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2016,
Cansiz M, Abbasov T, Kurt MB, Celik AR
Measurement 86: 159-164
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2016,
Luo K, Cao Z, Gao R, He J, Li GY, Gao HH, Zhang GS, Zhao HY
J Econ Entomol 109 (6): 2418-2423
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2016,
Casciola M, Tarek M
Biochim Biophys Acta (BBA) - Biomembranes 1858 (10): 2278-2289
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2016,
Leong SY, Burritt DJ, Oey I
Sci Rep 6: 25306
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2016,
Raaijmakers AJ, Luijten PR, van den Berg CA
NMR Biomed 29 (9): 1122-1130
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2016,
O'Hearn SF, Ackerman BJ, Mower MM
Biochem Biophys Rep 8: 249-253
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2016,
Kurita H, Takao Y, Kishikawa K, Takashima K, Numano R, Mizuno A
Biochem Biophys Rep 8: 81-88
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2016,
Levi V, Messina G, Franzini A, Zanin L, Castelli N, Dones I
World Neurosurg 91: 671.e5-7
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2016,
Japan Society for Occupational Health (JSOH)
J Occup Health 58 (5): 489-518
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2016 Management and Innovation Technology International Conference (MITicon), Bang-San. IEEE, Bang-San, Thailand; ISBN 978-1-5090-4106-0
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2016 IEEE PES 13th International Conference on Transmission & Distribution Construction, Operation & Live-Line Maintenance (ESMO), Columbus, OH, USA. IEEE; ISBN 978-1-5090-5166-3
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2016,
Oltean M, Sevastre I, Rodean I, Viju M, Tibuliac S
2016 IEEE PES 13th International Conference on Transmission & Distribution Construction, Operation & Live-Line Maintenance (ESMO), Columbus, OH, USA. IEEE; ISBN 978-1-5090-5166-3
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2016,
Liu H, Yao C, Mi Y, Li C, Zhao Y, Lv Y
2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC), San Francisco, CA, USA. IEEE; ISBN 978-1-5090-2355-4
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2016,
Jain S, Vojisavljevic V, Pirogova E
2016 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE), Pune, India. IEEE; ISBN 978-1-5090-3746-9
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2016,
Narang N, Dubey SK, Negi PS, Ojha VN
2016 International Conference on Signal Processing and Communication (ICSC), Noida, India. IEEE; ISBN 978-1-5090-2685-2
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2016,
Perrin Jr BS, Pastor RW
Biophys J 111 (6): 1248-1257
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Ministerium für Klimaschutz, Umwelt, Landwirtschaft, Natur und Verbraucherschutz des Landes Nordrhein Westfalen (MKULNV),
1-24
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Government of the United Kingdom,
Northern Ireland Statutory Rules, No.266: 1-20
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Government of the United Kingdom,
UK Statutory Instruments, No.588: 1-16
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2016,
Kral N, Hanna Ougolnikova A, Sena G
Regeneration 3 (3): 156-167
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2016,
Chilukuri S, Mueller G
J Drugs Dermatol 15 (11): 1402-1406
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2016,
Hayre N, Palm M, Jenkin P
J Drugs Dermatol 15 (12): 1557-1561
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2016,
Aziz PDA, Razak ALA, Bakar MIA, Aziz NA
2016 International Conference on Sustainable Energy Engineering and Application (ICSEEA), Jakarta, Indonesia. IEEE; ISBN 978-1-5090-2900-6
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2016,
Amon NR, Mahbub I, Saha PK
2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT), Dhaka, Bangladesh. IEEE; ISBN 978-1-5090-2907-5
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2016,
Lucano E, Liberti M, Lloyd T, Apollonio F, Wedan S, Kainz W, Angelone LM
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE; ISBN 978-1-4577-0220-4
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2016,
van Rhoon GC, Paulides MM, van Holthe JM, Franckena M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 359-362; ISBN 978-1-4577-0220-4
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2016,
Seo H, Kim D, Jun SC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 4618-4621; ISBN 978-1-4577-0220-4
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2016,
Wenger C, Bomzon Z, Salvador R, Basser PJ, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5664-5667; ISBN 978-1-4577-0220-4
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2016,
Miranda PC, Salvador R, Wenger C, Fernandes SR
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 6457-6460; ISBN 978-1-4577-0220-4
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2016,
Denzi A, Merla C, Casciola M, Hwang JC, Cheng X, Apollonio F, Liberti M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 4232-4235; ISBN 978-1-4577-0220-4
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2016,
Bastos R, Fernandes SR, Salvador R, Wenger C, de Carvalho MA, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 1754-1757; ISBN 978-1-4577-0220-4
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2016,
Datta A, Krause MR, Pilly PK, Choe J, Zanos TP, Thomas C, Pack CC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 1774-1777; ISBN 978-1-4577-0220-4
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2016,
Santos L, Martinho M, Salvador R, Wenger C, Fernandes SR, Ripolles O, Ruffini G, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 1778-1781; ISBN 978-1-4577-0220-4
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2016,
Hershkovich HS, Bomzon Z, Wenger C, Urman N, Chaudhry A, Garcia-Carracedo D, Kirson ED, Weinberg U, Wassermann Y, Palti Y
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 2357-2360; ISBN 978-1-4577-0220-4
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2016,
Fernandes SR, Salvador R, Wenger C, de Carvalho MA, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 3121-3124; ISBN 978-1-4577-0220-4
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2016,
Denzi A, Escobar JA, Nasta C, Merla C, Benassi B, Consales C, Apollonio F, Liberti M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 4189-4192; ISBN 978-1-4577-0220-4
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2016,
Macedo M, Wenger C, Salvador R, Fernandes SR, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5168-5171; ISBN 978-1-4577-0220-4
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2016,
Panescu D, Kroll MW, Brave M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5241-5245; ISBN 978-1-4577-0220-4