Die folgenden Begriffe wurden einbezogen:
"berufliche Exposition", "occupational exposure", 職業ばく露
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2017,
Moore SM, McIntosh RL, Iskra S, Lajevardipour A, Wood AW
Bioelectromagnetics 38 (5): 356-363
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2017,
Pirkkalainen H, Heiskanen T, Tonteri J, Elovaara J, Mika P, Korpinen L
Radiat Prot Dosimetry 176 (4): 400-403
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2017,
Choong M, Chy D, Guevarra JR, Ross AG
BMJ Case Rep 2017
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Eur J Radiol 89: 7-13
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J Radiol Prot 37 (1): 201-213
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2017,
Xu G, Su R, Lv J, Hu B, Gu H, Li X, Gu J, Yu X
Int J Legal Med 131 (3): 677-683
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2017,
Fatahi M, Karpowicz J, Gryz K, Fattahi A, Rose G, Speck O
Magn Reson Mater Phy 30 (3): 255-264
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2017,
Keevil SF, Lomas DJ
Br J Radiol 90 (1070): 20160813
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Environ Pollut 221: 501-505
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2017,
Altaf E, Mitchel EK, Berry C, Hossain A
Am J Forensic Med Pathol 38 (1): 11-13
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2017,
Freschi F, Giaccone L, Mitolo M
IEEE Trans Ind Appl 53 (2): 819-825
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2017,
Vila J, Bowman JD, Figuerola J, Moriña D, Kincl L, Richardson L, Cardis E
J Expo Sci Environ Epidemiol 27 (4): 398-408
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2017,
Karamanli H, Akgedik R
Acta Clin Belg 72 (5): 349-351
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2017,
Litchfield I, van Tongeren M, Sorahan T
Radiat Prot Dosimetry 175 (2): 178-185
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2017,
Møllerløkken OJ, Stavang H, Hansson Mild K
Int J Occup Saf Ergon 23 (1): 139-142
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2017,
Sokhal AK, Lodha KG, Kumari M, Paliwal R, Gothwal S
Burns 43 (1): 182-189
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2017,
Bonello J, Sammut CV
Int J Occup Saf Ergon 23 (1): 133-138
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2016,
Keine Autoren angegeben
BGBl I (54): 2531-2548
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2016,
Canova A, Freschi F, Giaccone L
2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA. IEEE: S. 1-7; ISBN 978-1-4799-8398-8
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2016,
Ravandi MRG, Mardi H, Khanjani N, Barkhordari A
J Magn 21 (2): 255-260
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2016,
Rachedi BA, Babouri A, Xun Z
Rev Roum Sci Techn – Électrotechn et Énerg 61 (2): 178-182
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 61140 VDE 0140-1:2016-11
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2016,
Biological Effects Policy Advisory Group (BEPAG)
The Institution of Engineering and Technology (IET),
IET Position statement - July 2016: 1-22
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2016,
Hamiti E, Ibrani M, Ahma L, Shala V, Halili R
Prog Electromagn Res M 50: 117-128
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2016,
Ibrani M, Hamiti E, Ahma L, Shala B
Int J Electron Commun 70 (6): 808-813