Die folgenden Begriffe wurden einbezogen:
"berufliche Exposition", "occupational exposure", 職業ばく露
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Int J Environ Res Public Health 19 (17): 10564
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Arch Civ Eng 68 (4): 537-554
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2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Bundesamt für Energie (BFE),
Statusbericht 2022: 1-204
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2022,
Ivanova M, Barudov E
2022 14th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: S. 1-4; ISBN 978-1-6654-9027-6
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2022,
Mocanu M, Huchitu A, Gandescu CH, Gkanatsios S
UPB Sci Bull, Series C: Electr Eng Comput Sci 84 (4): 323-338
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2022,
Krupski P, Michalowska J
Prz Elektrotechniczny 98 (12): 217-220
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2022,
Nataraja Moorthy T, Shari N, Rajesh Kumar N
J Krishna Inst Med Sci Univ 11 (3): 90-94
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2022,
Amicucci GL, Settino MT
2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Maldives, Maldives. IEEE: S. 1-7; ISBN 978-1-6654-7096-4
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J Comput Methods Sci Eng 22 (6): 2257-2266
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2022,
Wei S, Zhou C, Huang L
Lasers Med Sci 38 (1): 25
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2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: S. 1813-1819; ISBN 978-1-6654-7109-1
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2022,
Shaikh SA, Telang PA, Arora S
Cureus 14 (11): e31176
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2022,
Wyszkowska J, Pritchard C
Int J Environ Res Public Health 19 (23): 16150
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2022,
Alyami AS, Majrashi NA, Shubayr NA, Alatwah SM, Alyami J
J Med Imaging Radiat Sci 53 (4): 633-639
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2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: S. 1-4; ISBN 978-1-6654-0751-9
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2022,
Pavel I, David V, Roman MG, Bordas AM
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 484-488; ISBN 978-1-6654-8995-9
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2022,
Oh S, Hong SE, Choi HD
Int J Environ Res Public Health 19 (22): 15185
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2022,
Eblen ML, Ramirez-Bettoni E, Wallace K
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-7; ISBN 978-1-6654-7864-9
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2022,
Wold A, Rådman L, Norman K, Olausson H, Thordstein M
Brain Sci 12 (10): 1301
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2022,
Ramos V, Suárez OJ, Suárez S, Febles VM, Aguirre E, Zradziński P, Rabassa LE, Celaya-Echarri M, Marina P, Karpowicz J, Falcone F, Hernández JA
Appl Sci 12 (20): 10667
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2022,
Martinho E, Santos SR, de Souza DF
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-7; ISBN 978-1-6654-7864-9
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Energies 15 (19): 7230
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2022,
Yamaguchi-Sekino S, Iwakiri K, Sekino M, Nakai T
IEEJ Trans Electr Electron Eng 17 (7): 981-985
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2022,
Hammen L, Pichon L, Le Bihan Y, Bensetti M, Fleury G
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: S. 114-119; ISBN 978-1-6654-0789-2
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2022,
Barbosa Filho JML, Campos MMdM, Flor DL, Alves WS, D’Assunção AG, Rodrigues MEC, de Sousa VAJr
Sensors 22 (18): 7017