Die folgenden Begriffe wurden einbezogen:
"atomic force microscopy", Rasterkraftmikroskopie, "scanning force microscopy", 走査型フォース顕微鏡法, 原子間力顕微鏡
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2024,
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2024,
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2024,
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2022,
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2022,
Gorobets S, Gorobets O, Gorobets Y, Bulaievska M
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2020,
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2020,
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2019,
Chafai DE, Sulimenko V, Havelka D, Kubínová L, Dráber P, Cifra M
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2019,
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2018,
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2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: 174-177; ISBN 978-1-5386-1082-4
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2018,
Ding XF, Wu Y, Qu WR, Fan M, Zhao YQ
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2017,
Dutta D, Palmer XL, Asmar A, Stacey M, Qian S
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2017,
Steuer A, Wende K, Babica P, Kolb JF
Eur Biophys J 46 (6): 567-580
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2016,
Setayandeh SS, Lohrasebi A
J Mol Graph Model 70: 122-128
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2015,
Xu L, Guo W, Liu Y, Zhang X, Yu J, Wu W, Zhao T
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2015,
Xiong L, Sun CF, Zhang J, Gao YB, Wang LF, Zuo HY, Wang SM, Zhou HM, Xu XP, Dong J, Yao BW, Zhao L, Peng RY
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2014,
Thompson GL, Roth C, Tolstykh G, Kuipers M, Ibey BL
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2014,
Wang Z, Hao F, Ding C, Yang Z, Shang P
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2014,
Wu X, Cao MP, Shen YY, Chu KP, Tao WB, Song WT, Liu LP, Wang XH, Zheng YF, Chen SD, Zeng QL, Xia RH
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2013,
Choi S, Shin JH, Nam SW, Jang H, Tao T, Kwak HW, Jin KH, Lee GJ, Park HK
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2013,
Choi S, Choi HJ, Cheong Y, Lim YJ, Park HK
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2013,
Choi S, Cheong Y, Shin JH, Jin KH, Park HK
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2012,
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2011,
Liu Y, Qi H, Sun RG, Chen WF
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2010,
Chen WF, Qi H, Sun RG, Liu Y, Zhang K, Liu JQ
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2010,
Moroz VV, Chernysh AM, Kozlova EK, Borshegovskaya PY, Bliznjuk UA, Rysaeva RM, Gudkova OY
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2010,
Hammerick KE, James AW, Huang Z, Prinz FB, Longaker MT
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2009,
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2009,
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IET Nanobiotechnol 3 (2): 28-45
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2008,
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2007,
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2006,
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2006,
Teodori L, Albertini MC, Uguccioni F, Falcieri E, Rocchi MB, Battistelli M, Coluzza C, Piantanida G, Bergamaschi A, Magrini A, Mucciato R, Accorsi A
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2005,
Zhadobov M, Vié V, Sauleau R, Himdi M, Le Coq L, Artzner F, Orlov I, Thouroude D
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2005,
Voychuk SI, Gromozova EN, Lytvyn PM, Podgorsky VS
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2005,
Volokitin AI, Persson BN
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2004,
Rieti S, Manni V, Lisi A, Giuliani L, Sacco D, D'Emilia E, Cricenti A, Generosi R, Luce M, Grimaldi S
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2001,
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2000,
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2000,
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1998,
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