Die folgenden Begriffe wurden einbezogen:
"T wave", T-Welle, T-Zacke, T波
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2024,
Sandoval-Diez N, Belácková L, Fernandes Veludo A, Jalilian H, Guida F, Deltour I, Thielens A, Zahner M, Fröhlich J, Huss A, Röösli M
Open Res Eur 4: 206
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2024,
Gao H, Cole JP, Landry TO, Biberston JD, Guetersloh SB, Cardin S, Erwin WJ, Muffoletto IM, Benda JA, Kelly ER, Escobar RF, Voorhees WB, Wells KH, Stone R II, Tadlock MD, How RA, Van Gent JM, Gurney JM
Joint Trauma System (JTS),
Clinical Practice Guideline, CPG ID 98: 1-17
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2024,
Yang J, Zhu L, Li Q
2024 IEEE 25th China Conference on System Simulation Technology and its Application (CCSSTA), Tianjin, China. IEEE: S. 198-202; ISBN 9798350366617
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2024,
Tukimin R, Sapuan SZ, Yunoh WSW, Zainal NA
2024 IEEE 15th Control and System Graduate Research Colloquium (ICSGRC), SHAH ALAM, Malaysia. IEEE: S. 23-28; ISBN 9798350386561
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2024,
Liu S, Onishi T, Taki M, Watanabe S
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 995-996; ISBN 9798350369915
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2024,
Shamsul Kamal AM, Mohd Isa FN, Abdul Malekl NF, Mohamad SY
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 2711-2712; ISBN 9798350369915
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2024,
Butković I, Vince S, Lojkić M, Folnožić I, Tur SM, Vilić M, Malarić K, Berta V, Samardžija M, Kreszinger M, Žaja IŽ
Theriogenology 230: 243-249
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2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 2461-2462; ISBN 9798350369915
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2024,
Ali MZ, Kabonzo FM, Nedil M, Benmabrouk I, Al Hasan M
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 1227-1228; ISBN 9798350369915
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2024,
Roper CJ, Ma C, Hagness SC
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 2515-2516; ISBN 9798350369915