Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2014,
Chakaravarthi G, Arunachalam K
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 5320-5322; ISBN 978-1-4244-7929-0
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2014,
David M, Golberg R, Rubinsky B
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 5329-5331; ISBN 978-1-4244-7929-0
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2014,
Liorni I, Parazzini M, Fiocchi S, Guadagnin V, Ravazzani P
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 342-344; ISBN 978-1-4244-7929-0
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2014,
Mattei E, Censi F, Mancini M, Napolitano A, Genovese E, Cannata V, Burriesci G, Falsaperla R, Calcagnini G
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 890-893; ISBN 978-1-4244-7929-0
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2014,
Chen F, Qi H, Ming D, Zhou P
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 2613-2616; ISBN 978-1-4244-7929-0
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2014,
Lucke L, Bluvshtein V
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 286-289; ISBN 978-1-4244-7929-0
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2014,
Keine Autoren angegeben
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 6549-6552; ISBN 978-1-4244-7929-0
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2014,
Lv B, Su C, Yang L, Xie Y, Wu T
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: S. 986-989; ISBN 978-1-4244-7929-0
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2014,
Laakso I, Hirata A, Fujiwara O
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 202-205; ISBN 978-4-88552-287-1
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2014,
Sunohara T, Laakso I, Hirata A, Onishi T
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 449-452; ISBN 978-4-88552-287-1