Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2016,
Bormpantonakis PM, Stratakis DI, Mastorakis GN, Skeberis CN, Mavromoustakis CX, Bechet PV
2016 International Conference on Telecommunications and Multimedia (TEMU), Heraklion. IEEE: S. 1-5; ISBN 978-1-4673-8410-0
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2016,
Crotti G, Giaccone L, Giordano D
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016), Ottawa, ON. IEEE: S. 1-2; ISBN 978-1-4673-9135-1
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IEEE Nanotechnol Mag 10 (3): 30-38
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2016,
Thors B, Colombi D, Ying Z, Bolin T, Tornevik C
IEEE Access 4: 7469 - 7478
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2016,
Lay-Ekuakille A, Griffo G, Conversano F, Casciaro S, Massaro A, Bhateja V, Spano F
2016 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Benevento, Italy. IEEE: S. 1-6; ISBN 978-1-4673-9173-3
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2016,
Zanovello U, Zilberti L, Giordano D, Borsero M
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016), Ottawa, ON. IEEE: S. 1-2; ISBN 978-1-4673-9135-1
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2016,
Williams CF, Lloyd D, Lees J, Pirog A, Geroni GM, Pastre J, Kriegel V, Porch A
2016 IEEE MTT-S International Microwave Symposium (IMS), San Francisco, CA, USA. IEEE: S. 1-4; ISBN 978-1-5090-0699-1
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2016,
Jian J, Stanacevic M
2016 IEEE International Symposium on Circuits and Systems (ISCAS), Montreal, QC, Canada. IEEE: S. 2030-2033; ISBN 978-1-4799-5342-4
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2016,
Arkhypova K, Fisun A, Bilous O, Nosatov A, Malakhov V
2016 IEEE MTT-S International Microwave Symposium (IMS), San Francisco, CA, USA. IEEE: S. 1-3; ISBN 978-1-5090-0699-1
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2016,
Matveyenko OA, Komnatnov ME, Busygina AV, Zharkova LP
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), Erlagol. IEEE: S. 657-660; ISBN 978-1-5090-0787-5