Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2020,
He K, Yu M, Zhao E, Li G, Wang M, Ma J
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 635-636; ISBN 978-1-7281-6671-1
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2020,
Phaneuf M, Mojabi P
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1377-1378; ISBN 978-1-7281-6671-1
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2020,
Fontana N, Giampietri E, Canicattì E, Brizi D, Monorchio A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 307-308; ISBN 978-1-7281-6671-1
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2020,
Masumnia-Bisheh K, Furse C
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1989-1990; ISBN 978-1-7281-6671-1
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2020,
Brizi D, Fontana N, Canicatti E, Giampietri E, Monorchio A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1559-1560; ISBN 978-1-7281-6671-1
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2020,
Neophytou K, Antoniades MA
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1435-1436; ISBN 978-1-7281-6671-1
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2020,
Petrov PK, Velev GT, Ivanov KM, Varbov TK
2020 7th International Conference on Energy Efficiency and Agricultural Engineering (EE&AE), Ruse, Bulgaria. IEEE: S. 1-5; ISBN 978-1-7281-0363-1
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2020 IEEE 92nd Vehicular Technology Conference (VTC2020-Fall), Victoria, BC, Canada. IEEE: S. 1-5; ISBN 978-1-7281-9485-1
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2020,
Yamada Y, Kamardin K, Kamaruddin NA, Razali SHM, Zainudin N, Hlaing NW, Ja'afar H
2020 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: S. 1-4; ISBN 978-1-7281-8210-0
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2020,
Alahidin MF, Zakaria NA, Ismail Khan Z, Emileen Abd Rashid N, Shariff KKM, Enche Ab Rahim SA
2020 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: S. 1-4; ISBN 978-1-7281-8210-0