Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2020,
Winkler SA, Saniour I, Chaudhari A, Robb F, Vaughan JT
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: 1-3; ISBN 978-1-7281-5867-9
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2020,
Rajput S, Barbora A, Komoshvili K, Levitan J, Yahalom A, Liberman-Aronov S
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: 1-4; ISBN 978-1-7281-5867-9
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2020,
Celaya-Echarri M, Azpilicueta L, Lopez-Iturri P, Rodríguez-Corbo FA, Ramos V, Falcone F
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: 1153-1154; ISBN 978-1-7281-6671-1
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2020,
Yamazaki S, Harata M, Tsubouchi M, Ogawa Y, Isoyama G, Otani C, Hoshina H
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Buffalo, NY, USA. IEEE: 1-2; ISBN 978-1-7281-6621-6
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2020,
Xin-Yang S, Jing-Cheng L
2020 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Shanghai, China. IEEE: 1-3; ISBN 978-1-7281-5734-4
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2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE), Wuhan, China. IEEE: 1-7; ISBN 978-1-7281-9660-2
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2020,
Kaburcuk F, Elsherbeni AZ, Lumnitzer R, Tanner A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: 1309-1310; ISBN 978-1-7281-6671-1
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2020,
Mishra PK, Raj S, Tripathi VS
2020 IEEE 7th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON), Prayagraj, India. IEEE: 1-5; ISBN 978-1-6654-4747-8
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2020,
Tan T, Tan P, Shen H, Xu W, Pang L, Deng Y
2020 IEEE 9th International Power Electronics and Motion Control Conference (IPEMC2020-ECCE Asia), Nanjing, China. IEEE: 1905-1909; ISBN 978-1-7281-5302-5
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2020,
Vilagosh Z, Lajevardipour A, Wood A
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Buffalo, NY, USA. IEEE: 1; ISBN 978-1-7281-6621-6