Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2024,
Takashima K, Imura T, Hori Y
2024 IEEE 9th Southern Power Electronics Conference (SPEC), Brisbane, Australia. IEEE: S. 1-5; ISBN 9798350351163
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2024,
Djuric N, Kljajic D, Pasquino N, Solmonte N, Djuric S
2024 5th International Conference on Emerging Trends in Electrical, Electronic and Communications Engineering (ELECOM), Balaclava, Mauritius. IEEE: S. 1-6; ISBN 9798331532482
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2024,
de Araújo ARJ, Mokhtari M, Albano M, Clark D, Robson S, Shaban M, Guo D, Haddad A
2024 59th International Universities Power Engineering Conference (UPEC), Cardiff, United Kingdom. IEEE: S. 1-6; ISBN 9798350379747
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2024,
Liu W, Rao X, Chen X, Yu L
2024 IEEE 12th Asia-Pacific Conference on Antennas and Propagation (APCAP), Nanjing, China. IEEE: S. 1-2; ISBN 9798350351026
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2024,
Sangal S, Verma A, Patil S
2024 13th International Conference on System Modeling & Advancement in Research Trends (SMART), Moradabad, India. IEEE: S. 418-423; ISBN 9798350380590
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2024,
Verma P, Houde SS, Tiwari HP, Mishra J, Ramanathan D, Priyanka NB, Bajpai A, Mahendru S, Balasubramani PP
2024 International Conference on Brain Computer Interface & Healthcare Technologies (iCon-BCIHT), Thiruvananthapuram, India. IEEE: S. 201-206; ISBN 9798331540074
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2024,
Elmaadawy S, Jornet JM
2024 IEEE International Conference on E-health Networking, Application & Services (HealthCom), Nara, Japan. IEEE: S. 1-6; ISBN 9798350350555
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2024,
Qamar M, Kapusuz KY, Thaha MA, Alomainy A
2024 21st International Bhurban Conference on Applied Sciences and Technology (IBCAST), Murree, Pakistan. IEEE: S. 423-426; ISBN 9798331516697
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2024,
Arivarsi A, Kumar A, Misra A
2024 International Conference on Modeling, Simulation & Intelligent Computing (MoSICom), Dubai, United Arab Emirates. IEEE: S. 57-62; ISBN 9798331533328
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2024,
Akter MK, Guo R, Islam MZ, Zheng J, Chen J
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: S. 2655-2656; ISBN 9798350369915