Die folgenden Begriffe wurden einbezogen:
"Elektrisches Feld", EF, "electric field", 電界
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2018,
Taphoorn MJB, Dirven L, Kanner AA, Lavy-Shahaf G, Weinberg U, Taillibert S, Toms SA, Honnorat J, Chen TC, Sroubek J, David C, Idbaih A, Easaw JC, Kim CY, Bruna J, Hottinger AF, Kew Y, Roth P, Desai R, Villano JL, Kirson ED, Ram Z, Stupp R
JAMA Oncol 4 (4): 495-504
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2018,
Ishii N, Shimizu Y, Nagaoka T, Watanabe S
2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), Nagoya, Japan. IEEE: S. 1-2; ISBN 978-1-5386-4835-3
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2018,
Schwartz S, Thompson GL
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: S. 184-186; ISBN 978-1-5386-5919-9
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2018,
Sen R, Sarkar AK, Mandal AK, Paul LC
2018 International Conference on Innovation in Engineering and Technology (ICIET), Dhaka, Bangladesh. IEEE: S. 1-5; ISBN 978-1-5386-5230-5
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2018,
Shkliarskyi V, Matiieshyn Y, Grytsay V, Smarkutskyi T, Shckorbatov Y
2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavske, Ukraine. IEEE: S. 728-731; ISBN 978-1-5386-2557-6
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2018,
Williams CF, Lees J, Lloyd D, Geroni GM, Jones S, Ambala S, Baradat W, Comat G, Aboubakary A, Voisin S, Porch A
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: S. 199-201; ISBN 978-1-5386-5919-9
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2018,
Infante P, Tumalli L, Flores T, Gilart F
2017 IEEE 37th Central America and Panama Convention (CONCAPAN XXXVII), Managua, Nicaragua. IEEE: S. 1-7; ISBN 978-1-5386-3510-0
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2018,
Kosta P, Paknahad J, Rodríguez ESG, Loizos K, Roy A, Talbot N, Seidman S, Datta P, Dai R, Pollack B, Greenberg R, Lazzi G
IEEE J Electromagn RF Microw Med Biol 2 (1): 56 - 63
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2018,
Piper S, Ball L, Mandziuk M
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: S. 448-453; ISBN 978-1-5386-6622-7
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2018,
Taguchi K, Laakso I, Aga K, Hirata A, Diao Y, Chakarothai J, Kashiwa T
IEEE Access 6: 70186 - 70196