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キーワード:
t-検定, t-Test, "Student's t-test", スチューデントt-検定
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2010,
Okumura T, Muramoto Y, Shimizu N
2010 10th IEEE International Conference on Solid Dielectrics, Potsdam, Germany. IEEE; ISBN 978-1-4244-7945-0
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IEEE Microw Mag 11 (4): 112-114
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IEEE Antennas Propag Mag 52 (1): 267-273
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2010,
Kesari KK, Behari J
Toxicol Environ Chem 92 (6): 1135-1147
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2010,
Rinaldi S, Fontani V, Aravagli L, Mannu P
Health Qual Life Outcomes 8: 31
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2010,
Rinaldi S, Fontani V, Aravagli L, Lotti Margotti M
Stress Health 26 (5): 350-358
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2010,
Rinaldi S, Fontani V, Moretti E, Rosettani B, Aravagli L, Sarago G, Collodel G
Indian J Med Res 132 (2): 189-194
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2010,
Burke PT, Ghanbari H, Alexander PB, Shaw MK, Daccarett M, Machado C
J Interv Card Electrophysiol 28 (1): 59-66
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Association for the Advancement of Medical Instrumentation (AAMI),
AAMI TIR18:2010
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J R Soc Interface 7 (52): 1617-1625