キーワード:
Wahrscheinlichkeit, Irrtumswahrscheinlichkeit, probability, 確率
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2020,
Kiouvrekis Y, Manios G, Tsitsia V, Gourzoulidis G, Kappas C
Environ Res 191: 109940
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2020,
Chiaramello E, Tognola G, Bonato M, Gallucci S, Magne I, Souques M, Fiocchi S, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5690-3
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2020,
Al Hajj M, Wang S, De Doncker P, Oestges C, Wiart J
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: pp. 1-3; ISBN 978-1-7281-5690-3
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2020,
Lu H, Guo J, Hong X, Chen A, Zhang X, Shen S
Medicine 99 (39): e22256
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2020,
Yin K, Cheng L, Du WL, Hu XH, Shen YM
Zhonghua Shao Shang Za Zhi 36 (6): 433-439
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2020,
Piechowicz B, Sadło S, Woś I, Białek J, Depciuch J, Podbielska M, Szpyrka E, Kozioł K, Piechowicz I, Koziorowska A
Environ Res 190: 109989
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2020,
Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: pp. 429-433; ISBN 978-1-7281-5201-1
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2020,
Pfeiffer F, Benali A
Neural Regen Res 15 (11): 1977-1980
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2020,
Habelt B, Arvaneh M, Bernhardt N, Minev I
Bioelectron Med 6: 4
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2020,
Bonato M, Chiaramello E, Fiocchi S, Tognola G, Ravazzani P, Parazzini M
IEEE J Electromagn RF Microw Med Biol 4 (3): 179-186
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-2 VDE 0848-527-2-2:2019-11
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2019,
Masrakin K, Rahim HA, Soh PJ, Abdulmalek M, Adam I, Warip MNBM, Abbasi QH, Yang X
IEEE Access 7: 98946-98958
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2019,
Masumnia-Bisheh K, Forooraghi K, Ghaffari-Miab M, Furse CM
IEEE Trans Antennas Propag 67 (12): 7466-7475
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2019,
Aroke O, Doherty M, Esmaeili B
2019 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-7; ISBN 978-1-7281-0645-8
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2019,
Hurtado-Jimenez J, Leon-Grande AM, Cabello-Garcia JR, Lara-Raya FR
2019 6th International Advanced Research Workshop on Transformers (ARWtr), Cordoba, Spain. IEEE: pp. 99-104; ISBN 978-1-7281-0959-6
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2019,
Pavan A, Ghin F, Contillo A, Milesi C, Campana G, Mather G
Brain Stimul 12 (4): 967-977
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2019,
Özyurt MG, Haavik H, Nedergaard RW, Topkara B, Şenocak BS, Göztepe MB, Niazi IK, Türker KS
PLoS One 14 (12): e0225535
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2019,
Wen YZ, Zhang PH, Ren LC, Zhang MH, Zeng JZ, Zhou J, Liang PF, Huang XY
Zhonghua Shao Shang Za Zhi 35 (11): 784-789
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J Chem Phys 151 (20): 204101
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2019,
Migault L, Bowman JD, Kromhout H, Figuerola J, Baldi I, Bouvier G, Turner MC, Cardis E, Vila J
Ann Work Expo Health 63 (9): 1013-1028
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2019,
Bonato M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M, Ravazzani P
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: pp. 6910-3913; ISBN 978-1-5386-1312-2
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2019,
Brzozek C, Benke KK, Zeleke BM, Croft RJ, Dalecki A, Dimitriadis C, Kaufman J, Sim MR, Abramson MJ, Benke G
Int J Environ Res Public Health 16 (13): E2428
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2019,
Li N, Friedrich R, Maesano CN, Medda E, Brescianini S, Stazi MA, Sabel CE, Sarigiannis D, Annesi-Maesano I
Environ Res 179 Pt A: 108744
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2019,
Danker-Hopfe H, Dorn H, Eggert T, Sauter C
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-143/19: 1-226
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2019,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
Ann Telecommun 74 (1-2): 113–121
