[確率論的幾何学を用いた全体的ばく露の半経験的モデル] tech./dosim.

Semi-empirical Model of Global Exposure using Stochastic Geometry

著者: Gontier Q, Petrillo L, Rottenberg F, Horlin F, Wiart J, Oestges C, De Doncker P
掲載誌: 2021 IEEE International Conference on Communications Workshops (ICC Workshops), Montreal, QC, Canada. IEEE, 2021: pp. 1-5; ISBN 978-1-7281-9442-4
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