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5477件の論文が見つかりました。

キーワード: Funk, radio, 電波による

• 2024, Jangid P, Rai U, Singh R
  [高周波電磁放射はin vitroでライディッヒ細胞機能に干渉する] [med./bio.]
  PLoS One 19 (5): e0299017
• 2024, Bilson S, Loh TH, Héliot F, Thompson A
  Physics-Informed Machine Learning Modelling of RF-EMF Exposure in Massive MIMO Systems [tech./dosim.]
  IEEE Access 12: 69410-69422
• 2024, Jarvis RE, McDaniel JW
  Impact of Multi-Path Wave Propagation on Specific Absorption Rate in Layered Dielectrics [tech./dosim.]
  2024 IEEE Wireless and Microwave Technology Conference (WAMICON), Clearwater, FL, USA. IEEE: pp. 1-4; ISBN 9798350344950
• 2024, Khira R, Uggini GK
  [非電離高周波電磁放射がゼブラフィッシュの初期胚の発育と行動に及ぼす影響] [med./bio.]
  Electromagn Biol Med 43 (3): 156-163
• 2024, Katirci E, Kirimlioglu E, Oflamaz AO, Hidisoglu E, Cernomorcenco A, Yargıcoğlu P, Ozen S, Demir N
  [2100 MHzの甲種は放射に短期および中期ばく露したラットの精巣におけるTAM受容体およびリガンドの発現レベル] [med./bio.]
  Bioelectromagnetics 45 (5): 235-248
• 2024, Parker JE, Butterworth JW, Rodriguez RA, Kowalczewski CJ, Christy RJ, Voorhees WB, Payne JA, Whitmore JN
  [8.2および95 GHzのマイクロ波ばく露によるブタの皮膚の熱損傷] [med./bio.]
  Biomed Phys Eng Express 10 (4): 045024
• 2024, López-Soriano S, Melià-Seguí J, Parrón Granados J
  UHF RFID Wristbands: A Long-Range, Durable, Flexible, and Low-Cost Tag Antenna Design [tech./dosim.]
  IEEE J Radio Freq Identif 8: 125-133
• 2024, Dianovský R, Pecho P, Hrúz M, Velký P
  Safety of UAV Operations Around Base Transceiver Stations: Field Measurements and Analysis of Electromagnetic Interference [tech./dosim.]
  2024 New Trends in Civil Aviation (NTCA), Prague, Czech Republic. IEEE: pp. 133-139; ISBN 9798350317961
• 2024, Goh J, Suh D, Park G, Jeon S, Lee Y, Kim N, Song K
  [安定的な出力モニタリングおよび効率的な熱制御を備えた1.7 GHz LTE高周波電磁界には各種のヒト細胞の増殖への影響はない] [med./bio.]
  PLoS One 19 (5): e0302936
• 2024, Indhumathi K, Jeyarani SS, Shalini S
  Breast Cancer Detection using RF Resonator in 5G Communication [tech./dosim.]
  2024 5th International Conference on Intelligent Communication Technologies and Virtual Mobile Networks (ICICV), Tirunelveli, India. IEEE: pp. 618-626; ISBN 9798350385656