キーワード:
"electromagnetic field", "Elektromagnetisches Feld", EMF, 電磁界
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-5; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020,
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-5; ISBN 978-1-7281-5580-7
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2020,
Simonazzi M, Sandrolini L, Reggiani U
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-5; ISBN 978-1-7281-5580-7
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2020,
Song X, Yue Y, Zhu X, Chang H
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020,
Bonato M, Dossi L, Chiaramello E, Fiocchi S, Gallucci S, Tognola G, Ravazzani P, Parazzini M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020,
Gravina A, Moglie F, Bastianelli L, Mariani Primiani V
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-6; ISBN 978-1-7281-5580-7
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2020,
Cruciani S, Campi T, Maradei F, Feliziani M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-4; ISBN 978-1-7281-5580-7
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2020,
Kyun Woo M, DelaBarre L, Lee BY, Waks M, Lagore RL, Radder J, Eryaman Y, Ugurbil K, Adriany G
IEEE Access 8: 203555-203563
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2020,
Joshi P, Ghasemifard F, Colombi D, Törnevik C
IEEE Access 8: 204068-204075
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IEEE Consumer Electronics Magazine 9 (6): 41-48
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2020,
Lämmle T, Parspour N, Mönch M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: pp. 1-6; ISBN 978-1-7281-7363-4
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2020,
Murakawa T, Diao Y, Rashed EA, Kodera S, Tanaka Y, Kamimura Y, Kitamura S, Uehara S, Otaka Y, Hirata A
IEEE Access 8: 200995-201004
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2020,
Migdał P, Roman P, Strachecka A, Murawska A, Bieńkowski P
Apidologie 51: 956–967
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2020,
Blay RM, Pinamang AD, Sagoe AE, Owusu EDA, Koney NK, Arko-Boham B
Int J Reprod Med 2020: 6908458
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2020,
Choi YJ, Moskowitz JM, Myung SK, Lee YR, Hong YC
Int J Environ Res Public Health 17 (21): E8079
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2020,
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Res Rep Urol 12: 527-532
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2020,
Sawai H, Kurimoto M, Suzuki Y, Yamaguchi Y, Murata A, Suganuma E, Yamamoto K, Kuzuya H, Ueno S, Koide S, Koide H, Kamiya A
Am J Case Rep 21: e926647
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2020,
Moisset X, Bouhassira D, Avez Couturier J, Alchaar H, Conradi S, Delmotte MH, Lanteri-Minet M, Lefaucheur JP, Mick G, Piano V, Pickering G, Piquet E, Regis C, Salvat E, Attal N
Rev Neurol 176 (5): 325-352
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2020,
Dos Santos MAL, de Santana FS, Soares AF, de Sousa SF, Menezes LS, Takeshita WM
Gen Dent 68 (6): 70-74
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2020,
Matalatala M, Shikhantsov S, Deruyck M, Tanghe E, Plets D, Goudos S, Martens L, Joseph W
IEEE Access 8: 206371-206387
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2020,
Cassani R, Novak GS, Falk TH, Oliveira AA
J Neuroeng Rehabil 17: 147
