著者:
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
掲載誌: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE, 2020: 1-5; ISBN 978-1-7281-5580-7
