-
2015,
Hamiti E, Ibrani M, Ahma L, Halili R, Berisha D, Shala V
2015 9th International Conference on Next Generation Mobile Applications, Services and Technologies, Cambridge. IEEE: pp. 188-192; ISBN 978-1-4799-8660-6
-
2015,
Aoki Y, Arima T, Uno T, Chakarothai J, Wake K, Fujii K, Watanabe S
2015 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Hsinchu, Taiwan. IEEE: pp. 1-2; ISBN 978-1-4673-6952-7
-
2015,
Hashimoto I, Shiba K
2015 IEEE Biomedical Circuits and Systems Conference (BioCAS), Atlanta, GA, USA. IEEE: pp. 1-4; ISBN 978-1-4799-7234-0
-
2015 57th International Symposium ELMAR (ELMAR), Zadar, Croatia. IEEE: pp. 161-166; ISBN 978-953-184-209-9
-
2015,
Kazemipour A, Charles M, Allal D, Borsero M, Zilberti L, Bottauscio O, Chiampi M, Kleine-Ostmann T, Schrader T
2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Hong Kong. IEEE: pp. 1-2; ISBN 978-1-4799-8272-1
-
2015,
Zhang C, Zhang G, Wang A, Wu C, Huo X
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: pp. 4594-4597; ISBN 978-1-4244-9271-8
-
2015,
Bomzon Z, Urman N, Wenger C, Giladi M, Weinberg U, Wasserman Y, Kirson ED, Miranda PC, Palti Y
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: pp. 6888-6891; ISBN 978-1-4244-9271-8
-
2015,
Moraitis N, Christopoulou M, Nikita KS, Voulgaridou GP, Anestopoulos I, Panagiotidis MI, Pappa A
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: pp. 2592-2595; ISBN 978-1-4244-9271-8
-
2015,
Hamnerius Y, Nilsson T, Attback K
2015 1st URSI Atlantic Radio Science Conference (URSI AT-RASC), Gran Canaria, Spain. IEEE: p. 1; ISBN 9789090086286
-
2015,
Milad Zaltum MA, Adon MN, Hamdan S, Dalimin MN, Mahadi Abdul Jamil M
2015 International Conference on BioSignal Analysis, Processing and Systems (ICBAPS), Kuala Lumpur,. IEEE: pp. 33-36; ISBN 978-1-4799-6879-4