キーワード:
"transmission electron microscopy", Transmissions-Elektronenmikroskopie, 透過電子顕微鏡法
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2004,
Mi Y, Sun C, Yao C, Xiong L, Liao R, Hu Y, Hu L
The 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Francisco, CA, USA. IEEE: 5005-5008; ISBN 978-0-7803-8439-2
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2004,
Hutten A, Sudfeld D, Ennen I, Reiss G, Hachmann W, Heinzmann U, Wojczykowski K, Jutzi P, Saikaly W, Thomas G
J Biotechnol 112 (1-2): 47-63
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2002,
Jonas L, Fulda G, Nizze H, Zimmermann R, Gross G, Zack F, Kroning G, Holzhuter G, Haas HJ
Ultrastruct Pathol 26 (3): 153-159
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Pak J Biol Sci 5 (9): 931-937
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2001,
Qin ZQ, Gong YC, Huang XH
[ラットでの電撃傷の超微細構造的変化]
[foreign-language]
Fa Yi Xue Za Zhi 17 (3): 142-144
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2001,
Winklhofer M, Holtkamp-Rötzler E, Hanzlik M, Fleissner G, Petersen N
Eur J Mineral 13 (4): 659-669
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2001,
Rowan NJ, MacGregor SJ, Anderson JG, Cameron D, Farish O
Appl Environ Microbiol 67 (6): 2833-2836
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2001,
Holandino C, Veiga VF, Rodrigues ML, Morales MM, Capella MA, Alviano CS
Bioelectromagnetics 22 (7): 470-478
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1999,
Kues HA, D'Anna SA, Osiander R, Green WR, Monahan JC
Bioelectromagnetics 20 (8): 463-473
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1998,
Lopez MJ, Hayashi K, Fanton GS, Thabit 3rd G, Markel MD
Arthroscopy 14 (5): 495-501