研究状況の概観

• 2024, Cai W, Xiao Y, Yan J, Peng H, Tu C
  EMF treatment delays mesenchymal stem cells senescence during long-term in vitro expansion by modulating autophagy [med./bio.]
  Front Cell Dev Biol 12: 1489774
• 2024, Lu ZJ, Gu HY, Li ZQ, Lin FX
  Low frequency‑pulsed electromagnetic fields promote osteogenic differentiation of bone marrow‑derived mesenchymal stem cells by regulating connexin 43 expression [med./bio.]
  Exp Ther Med 28 (6): 446
• 2024, Soydas T, Yenmis G, Tuncdemir M, Kalkan MT, Sarac EY, Bilir A, Sultuybek GK
  [メトホルミンはNF-kBの抑制を介して高齢マウス線維芽細胞における50 Hz磁界によって潜在的に誘導される発がんを抑制する] [med./bio.]
  J Cell Mol Med 28 (19): e70132
• 2024, Sincak M, Adamkova P, Demeckova V, Smelko M, Lipovsky P, Oravec M, Luptakova A, Sedlakova-Kadukova J
  [弱い都市電磁界の影響を評価する際のモデル生物選択の重要な役割：ヒトの健康への含意] [med./bio.]
  Bioelectrochemistry 160: 108756
• 2024, Colciago A, Mohamed T, Colleoni D, Melfi V, Magnaghi V
  [電磁界が誘導するDNAメチル化、ヒストン脱アセチル化、酸化ストレスを介したシュワン細胞の適応応答] [med./bio.]
  J Cell Physiol 239 (11): e31365
• 2024, Bajtoš M, Radil R, Janoušek L, Dang N
  Assessing Biological Responses of Saccharomyces Cerevisiae to Low-Frequency Electromagnetic Fields: Insights and Implications [med./bio.]
  2024 ELEKTRO (ELEKTRO), Zakopane, Poland. IEEE: pp. 1-4; ISBN 9798350372366
• 2024, Chittora R, Jain S, Roy A, Pandey S, Kochhar KP
  Multifactorial effects of short duration early exposure low intensity magnetic field stimulation in Streptozotocin induced Alzheimer's disease rat model [med./bio.]
  Neurosci Lett 836: 137878
• 2024, Isaković J, Slatković F, Jagečić D, Petrović DJ, Mitrečić D
  [脈動超低周波電磁界はマウス神経幹細胞のアストロサイト様表現型への分化に影響を及ぼす：イン・ビトロパイロット研究] [med./bio.]
  Int J Mol Sci 25 (7): 4038
• 2024, Wang Z, Li S, Wu Z, Kang Y, Xie S, Cai Z, Shan X, Li Q
  [パルス電磁界支援還元酸化グラフェン複合3Dプリント神経足場はラットの坐骨神経再生を促進する] [med./bio.]
  Biofabrication 16 (3): 035013
• 2024, Bajtoš M, Dang N, Gurhan H, Barnes F
  Low-Frequency Magnetic Field and Cancer Cells [med./bio.]
  2024 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: pp. 9-10; ISBN 9798350394498