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2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: pp. 1-8; ISBN 978-1-5386-1560-7
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Taphoorn MJB, Dirven L, Kanner AA, Lavy-Shahaf G, Weinberg U, Taillibert S, Toms SA, Honnorat J, Chen TC, Sroubek J, David C, Idbaih A, Easaw JC, Kim CY, Bruna J, Hottinger AF, Kew Y, Roth P, Desai R, Villano JL, Kirson ED, Ram Z, Stupp R
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2017 IEEE 37th Central America and Panama Convention (CONCAPAN XXXVII), Managua, Nicaragua. IEEE: pp. 1-7; ISBN 978-1-5386-3510-0
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McDermott B, Porter E, Hughes D, McGinley B, Lang M, O'Halloran M, Jones M
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2018 Open Innovations Conference (OI), Johannesburg, South Africa. IEEE: pp. 170-175; ISBN 978-1-5386-5319-7
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Higuera-Hernández MF, Reyes-Cuapio E, Gutiérrez-Mendoza M, Rocha NB, Veras AB, Budde H, Jesse J, Zaldívar-Rae J, Blanco-Centurión C, Machado S, Murillo-Rodríguez E
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