キーワード:
Störabstand, Signal-Rausch-Verhältnis, S/N, SNR, "signal-to-noise ratio", 信号対雑音比
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2024,
Longpré-Poirier C, Miron JP, Garel N, Samson-Daoust E, Rizkallah E, Desbeaumes Jodoin V, Juster RP, Lespérance P
Psychiatry Res 340: 116122 [in press]
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2024,
Zanetti AS, Saroka KS, Dotta BT
Brain Res: 149158 [in press]
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2024,
Tremêa GTF, Kleibert KRU, Krause LS, Fell APW, Scapini AR, Marschall KW, Baiotto CS, da Silva MHT, da Silva JAG, Colet CF
J Evid Based Integr Med 29
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2024,
Papp D, Gilbert KM, Cereza G, D'Astous A, Lopez-Rios N, Boudreau M, Couch MJ, Yazdanbakhsh P, Barry RL, Alonso-Ortiz E, Cohen-Adad J
Magn Reson Med [in press]
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2024,
Liu Y, Xiao X, Kong X, Pang Y
2024 Photonics & Electromagnetics Research Symposium (PIERS), Chengdu, China. IEEE: 1-6; ISBN 9798350375916
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2024,
Akdag MZ, Dasdag S, Gelir A, Akdag MB, Gem M, Baksi N, Akpinar F, Bicak T, Arica E, Kutluer S, Arican R, Kilinc H
Biotechnol Biotechnol Equip 38 (1): 2385415
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2024,
Schlieper-Scherf S, Hebach N, Hausmann D, Azorin DD, Hoffmann DC, Horschitz S, Maier E, Koch P, Karreman MA, Etminan N, Ratliff M
J Neurooncol [in press]
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2024,
Lee W, Ryu K, Li Z, Oscanoa J, Wu Y, Robb F, Vasanawala S, Pauly J, Scott G
IEEE Trans Biomed Eng [in press]
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2024,
Kaveti R, Jakus MA, Chen H, Jain B, Kennedy DG, Caso EA, Mishra N, Sharma N, Uzunoğlu BE, Han WB, Jang TM, Hwang SW, Theocharidis G, Sumpio BJ, Veves A, Sia SK, Bandodkar AJ
Sci Adv 10 (32): eado7538
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2024,
Dalhuisen I, van Oostrom I, Spijker J, Wijnen B, van Exel E, van Mierlo H, de Waardt D, Arns M, Tendolkar I, van Eijndhoven P
Am J Psychiatry [in press]
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2024,
Karpowicz J, Miclaus S
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Di Capua G, Maffucci A, Capriglione D, Di Mambro G, Femia N, Oliva N, De Guglielmo L
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Gryz K, Karpowicz J, Zradziński P
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Pasquino N, Solmonte N, Djuric N, Kljajic D, Djuric S
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Miclaus S, Deaconescu DB, Vatamanu D, Buda AM
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 01-06; ISBN 9798350370546
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2024,
Petrita T, Deaconescu DB, Miclaus S
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-4; ISBN 9798350370546
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2024,
Valbonesi S, Garzia A, Mammi E, Sebastian NC, Ricciardi L, Ermini M, Folli M, Grazioso P, Senesi F
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Adda S, Bottura V, D'Elia S, Pasquino N, Suman R, Vaccarono M
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-5; ISBN 9798350370546
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2024,
Lodato F, Garzia A, Valbonesi S, Ruello G, Iodice A, Matera F, Salvo P, Massa R
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Adda S, Aureli T, D'Elia S, Franci D, Pasquino N, Pavoncello S, Strappini M, Suman R
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Radovic L, Turovic R, Djuric N, Skoric T, Kljajic D
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-5; ISBN 9798350370546
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2024,
Franci D, Pavoncello S, Coltellacci S, Strappini M, Aureli T, Marsico G
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-5; ISBN 9798350370546
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2024,
Milutinov M, Bjelica J, Kljajic D, Djuric N, Djuric S, Pasquino N
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-6; ISBN 9798350370546
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2024,
Li B, Zhang X, Qiao N, Chen J, Bi W, Zhi W, Ma L, Miao C, Wang L, Zou Y, Hu X
Bioelectromagnetics [in press]
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2024,
Ajmal A, Yamazaki K, Tamura N, Ait Bamai Y, Yoshikawa T, Hikage T, Ikeda A, Kishi R
Environ Res: 119715 [in press]