Challenges and Opportunities from the Out-of-Band Sensitivity of Data Loggers in a (Quasi)Autonomous Evaluation of Electromagnetic Exposure temp.

著者: Gryz K, Karpowicz J, Zradziński P
掲載誌: 2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE, 2024: 1-6; ISBN 9798350370546
RISフォーマットで参考文献をダウンロード

ばく露