キーワード:
Referenzwerte, "Abgeleitete Grenzwerte", "reference levels", 参考レベル
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2019,
Tajima K, Komeda K, Miyota Y, Hikage T
2019 International Symposium on Antennas and Propagation (ISAP), Xi'an, China. IEEE: 1-3; ISBN 978-1-7281-5113-7
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2019,
Bailey WH, Bodemann R, Bushberg J, Chou CK, Cleveland R, Faraone A, Foster KR, Gettman KE, Graf K, Harrington T, Hirata A, Kavet R, Keshvari J, Klauenberg BJ, Legros A, Maxson DP, Osepchuk JM, Reilly JP, Tell RA, Thansandote A, Yamazaki K, Ziskin MC, Zollman PM
IEEE Access 7: 171346-171356
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2019,
Werner R, Knipe P, Iskra S
IEEE Access 7: 170682-170689
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2019,
Gomez-Tames J, Rashed E, Hirata A, Tarnaud T, Tanghe E, Van de Steene T, Martens L, Joseph W
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 162-165; ISBN 978-1-7281-1639-6
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2019,
Laakso I, Lehtinen T
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 334-337; ISBN 978-1-7281-1639-6
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2019,
Willmann B, Rabe H, Leugers C, Sassi O, Waldera C, Vick R
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: 513-517; ISBN 978-1-7281-0595-6
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2019,
Migault L, Bowman JD, Kromhout H, Figuerola J, Baldi I, Bouvier G, Turner MC, Cardis E, Vila J
Ann Work Expo Health 63 (9): 1013-1028
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0
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2019,
Nagaoka T, Watanabe S
IEEE Access 7: 135909 - 135916
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2019,
Koutsi E, Deligiannis S, Sarantopoulos I, Zarbouti D, Athanasiadou G, Tsoulos G
2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST), Thessaloniki, Greece. IEEE: 1-4; ISBN 978-1-7281-1185-8