2018,
Eeftens M, Struchen B, Birks LE, Cardis E, Estarlich M, Fernandez MF, Gajšek P, Gallastegi M, Huss A, Kheifets L, Meder IK, Olsen J, Torrent M, Trček T, Valič B, Vermeulen R, Vrijheid M, van Wel L, Guxens M, Röösli M
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: pp. 92-94; ISBN 978-1-5090-3955-5
2018,
Foster KR, Ziskin MC, Balzano Q, Bit-Babik G