-
Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.3-2021: 1-240, ISBN 978-1-5044-7510-5
-
2021,
Kim I, Lee SG, Nam YH, Lee JH
Sensors 21 (4): 1431
-
2021,
Le Coq L, Mézières N, Leroy P, Fuchs B
Sensors 21 (4): 1438
-
2021,
van Wel L, Liorni I, Huss A, Thielens A, Wiart J, Joseph W, Röösli M, Foerster M, Massardier-Pilonchery A, Capstick M, Cardis E, Vermeulen R
J Expo Sci Environ Epidemiol 31 (6): 999-1007
-
2021,
Birks LE, van Wel L, Liorni I, Pierotti L, Guxens M, Huss A, Foerster M, Capstick M, Eeftens M, El Marroun H, Estarlich M, Gallastegi M, Safont LG, Joseph W, Santa-Marina L, Thielens A, Torrent M, Vrijkotte T, Wiart J, Röösli M, Cardis E, Vermeulen R, Vrijheid M
Environ Res 193: 110505
-
2021,
Cabré-Riera A, van Wel L, Liorni I, Thielens A, Birks LE, Pierotti L, Joseph W, González-Safont L, Ibarluzea J, Ferrero A, Huss A, Wiart J, Santa-Marina L, Torrent M, Vrijkotte T, Capstick M, Vermeulen R, Vrijheid M, Cardis E, Röösli M, Guxens M
Int J Hyg Environ Health 231: 113659
-
2020,
Rotenberg SA, Podilchak SK, Re PDH, Mateo-Segura C, Goussetis G, Lee J
IEEE Trans Microw Theory Tech 68 (5): 1921-1932
-
2020,
Monfared O, Tahayori B, Freestone D, Nešić D, Grayden DB, Meffin H
J Neural Eng 17 (1): 016037
-
2020,
Vilagosh Z, Lajevardipour A, Wood A
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Buffalo, NY, USA. IEEE: p. 1; ISBN 978-1-7281-6621-6
-
2020,
Bejenaru O, Lazarescu C, Ursachianu MV, Salceanu A
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 322-326; ISBN 978-1-7281-8127-1
