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7257件の論文が見つかりました。

キーワード: 電力周波数, Netzfrequenz, "50 Hz", "60 Hz", "power frequency"

• 2019, Hanafy MS, El-Shaer NH, El Attar A, Arafa MH
  A Study on the Effect of Vitamin E on Histomorphological and Immunohistochemical Changes Induced By Electromagnetic Field [med./bio.]
  Egypt Acad J Biol Sci B Zool 11 (1): 85-99
• 2019, Rageh MM, Mohamad EA, El-Garhy MR
  Magnetic Field Improves the Efficiency of Low Dose Cis-Platin by Alteration the Oxidative Stress in Ehrlich Carcinoma-Bearing Mice [med./bio.]
  Egypt Acad J Biol Sci B Zool 11 (3): 107-112
• 2019, Kheiry EV, Haddad F
  Protecting Effect of Vitamin E against Chromosomal Damage Induced by an Extremely Low-frequency Electromagnetic Field in Murine Bone Marrow Erythrocytes [med./bio.]
  J Pharm Res Int 28 (1): 1-8
• 2019, Li Y, Heroux P
  Magnetic Fields Trump Oxygen in Controlling the Death of Erythro-Leukemia Cells [med./bio.]
  Appl Sci 9 (24): 5318
• 2019
  [List of limit values 2019 - Safety and health protection in the workplace] [guideline]
  German Social Accident Insurance (DGUV), IFA Report, 1/2019: 1-211, ISBN 978-3-86423-237-4
• 2019, Michalak I, Lewandowska S, Niemczyk K, Detyna J, Bujak H, Arik P, Bartniczak A
  [詳細] [静磁界／交番磁界にばく露したダイズ種子と藻類抽出物の発芽] [med./bio.]
  Eng Life Sci 19 (12): 986-999
• 2019, Prasad KY, Punekar GS
  [500 kV四重回路送電線による電界：公衆ばく露に関する幾つかの側面] [tech./dosim.]
  2019 4th International Conference on Electrical, Electronics, Communication, Computer Technologies and Optimization Techniques (ICEECCOT), Mysuru, India. IEEE: pp. 332-335; ISBN 978-1-7281-3262-4
• 2019, Hu C, Fan X, He L, Li X, Tong L
  [均質化法によるMCRの電磁熱的有限要素モデリング] [tech./dosim.]
  2019 IEEE 3rd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: pp. 1727-1731; ISBN 978-1-7281-1676-1
• 2019, Wang Y, Wen Y
  [リニア同期モーターによる磁気浮上式列車の電磁放射] [tech./dosim.]
  2019 IEEE 3rd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: pp. 1507-1512; ISBN 978-1-7281-1676-1
• 2019, Park SD
  [電気事故の痛みを伴う記憶] [basics]
  2019 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-4; ISBN 978-1-7281-0645-8