キーワード:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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[LTE端末のSAR値分析]
[tech./dosim.]
International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, 2012. IEEE: 1-4; ISBN 978-1-4673-0717-8
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2012,
Kakikawa M, Yamada S
IEEE Trans Magn 48 (11): 2869-2872
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2012,
Nicolopoulou EP, Gonos IF, Stathopulos IA, Karabetsos E
IEEE Electromagn Compat Mag 1 (2): 50-59
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IEEE Transactions on Power Delivery 27 (1): 401-410
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2012,
Ganesh Bharadwaj CV, Yuanjin Z
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 6604-6607; ISBN 978-1-4577-1787-1
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2012,
Kroll MW, Fish RM, Calkins H, Halperin H, Lakkireddy D, Panescu D
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 689-693; ISBN 978-1-4577-1787-1
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2012,
Salvador R, Ramirez F, V'yacheslavovna M, Miranda PC
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 787-790; ISBN 978-1-4577-1787-1
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2012,
Camera F, Paffi A, Merla C, Denzi A, Apollonio F, Marracino P, D'Inzeo G, Liberti M
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 2567-2570; ISBN 978-1-4577-1787-1
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2012,
Grant PF, Lowery MM
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 4148-4151; ISBN 978-1-4577-1787-1
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2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 5745-5748; ISBN 978-1-4577-1787-1