キーワード:
"reference levels", "Abgeleitete Grenzwerte", Referenzwerte, 参考レベル
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Ann Work Expo Health 64 (8): 838-851
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Celaya-Echarri M, Azpilicueta L, Karpowicz J, Ramos V, Lopez-Iturri P, Falcone F
IEEE Access 8: 100930-100947
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2020,
Christ A, Samaras T, Neufeld E, Kuster N
Bioelectromagnetics 41 (5): 348-359
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2020,
de Goede AA, Cumplido-Mayoral I, van Putten MJAM
Brain Topogr 33 (4): 425-437
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2020,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
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2020,
Zheng KY, Dai GY, Lan Y, Wang XQ
Front Neurosci 14: 106
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2020,
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Environ Sci Pollut Res 27 (13): 14735-14750
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2020,
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2020,
Aerts S, Van Den Bossche M, Vergara X, Odie S, Verloock L, Martens L, Joseph W
Environ Res 183: 109196
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2020,
Karastergios I, Gialofas A, Karabetsos E
Radiat Prot Dosimetry 188 (4): 413-423
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2020,
Huang L, Meng C, Li Y, Yang J, Xiong J, Wu P, Jiang Y
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2020,
Liorni I, Lisewski T, Capstick MH, Kuehn S, Neufeld E, Kuster N
IEEE Trans Electromagn Compat 62 (4): 1323-1332
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50364 VDE 0848-364:2019-05
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2019,
Scientific Advisory Committee on Radio Frequencies and Health (CCARS)
1-15
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2019,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2019:08: 1-104
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International Electrotechnical Commission (IEC),
IEC 62311:2019: 1-71, ISBN 978-2-8-3226763-9
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2019,
Tajima K, Komeda K, Miyota Y, Hikage T
2019 International Symposium on Antennas and Propagation (ISAP), Xi'an, China. IEEE: pp. 1-3; ISBN 978-1-7281-5113-7
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2019,
Bailey WH, Bodemann R, Bushberg J, Chou CK, Cleveland R, Faraone A, Foster KR, Gettman KE, Graf K, Harrington T, Hirata A, Kavet R, Keshvari J, Klauenberg BJ, Legros A, Maxson DP, Osepchuk JM, Reilly JP, Tell RA, Thansandote A, Yamazaki K, Ziskin MC, Zollman PM
IEEE Access 7: 171346-171356
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2019,
Werner R, Knipe P, Iskra S
IEEE Access 7: 170682-170689
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2019,
Gomez-Tames J, Rashed E, Hirata A, Tarnaud T, Tanghe E, Van de Steene T, Martens L, Joseph W
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 162-165; ISBN 978-1-7281-1639-6
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2019,
Laakso I, Lehtinen T
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 334-337; ISBN 978-1-7281-1639-6
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2019,
Willmann B, Rabe H, Leugers C, Sassi O, Waldera C, Vick R
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: pp. 513-517; ISBN 978-1-7281-0595-6
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2019,
Migault L, Bowman JD, Kromhout H, Figuerola J, Baldi I, Bouvier G, Turner MC, Cardis E, Vila J
Ann Work Expo Health 63 (9): 1013-1028
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0
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2019,
Nagaoka T, Watanabe S
IEEE Access 7: 135909 - 135916
