キーワード:
"reference levels", "Abgeleitete Grenzwerte", Referenzwerte, 参考レベル
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2019,
Laakso I, Lehtinen T
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 334-337; ISBN 978-1-7281-1639-6
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2019,
Willmann B, Rabe H, Leugers C, Sassi O, Waldera C, Vick R
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: pp. 513-517; ISBN 978-1-7281-0595-6
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2019,
Migault L, Bowman JD, Kromhout H, Figuerola J, Baldi I, Bouvier G, Turner MC, Cardis E, Vila J
Ann Work Expo Health 63 (9): 1013-1028
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0
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2019,
Nagaoka T, Watanabe S
IEEE Access 7: 135909 - 135916
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2019,
Koutsi E, Deligiannis S, Sarantopoulos I, Zarbouti D, Athanasiadou G, Tsoulos G
2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST), Thessaloniki, Greece. IEEE: pp. 1-4; ISBN 978-1-7281-1185-8
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2019,
Mohamed AAS, Meintz A, Schrafel P, Calabro A
IEEE Transactions on Vehicular Technology 68 (8): 7477 - 7487
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2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), Opatija, Croatia. IEEE: pp. 486-490; ISBN 978-1-5386-9296-7
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2019,
Koutsojannis C, Andrikopoulos A, Seimenis I, Adamopoulos A
Radiat Prot Dosimetry 185 (4): 532-541
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2019,
Weldu YW, Mannan M, Al-Ghamdi SG
Health Phys 117 (6): 648-655
