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6160件の論文が見つかりました。

キーワード: "Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会

• 2008, Findlay RP, Dimbylow PJ
  [65 MHz-2 GHzの接地面からの電磁界の反射による人体ボクセルファントムにおけるSAR分布の計算] [tech./dosim.]
  Phys Med Biol 53 (9): 2277-2289
• 2008, Fuentes MA, Trakic A, Wilson SJ, Crozier S
  [選択されたMR環境での医療勤務者に対する磁界ばく露の解析と測定] [tech./dosim.]
  IEEE Trans Biomed Eng 55 (4): 1355-1364
• 2008, Shiba K, Nukaya M, Tsuji T, Koshiji K
  [人工心臓用の植え込み式変換器周辺組織の電流密度とSARの解析] [tech./dosim.]
  IEEE Trans Biomed Eng 55 (1): 205-213
• 2008, Leitgeb N, Cech R
  [低周波電界磁界への同時ばく露のドシメトリック的な評価] [tech./dosim.]
  IEEE Trans Biomed Eng 55 (2): 671-674
• 2008, Aly AA, Cheema MI, Tambawala M, Laterza R, Zhou E, Rathnabharathi K, Barnes FS
  [詳細] [ヒト好中球のインビトロでの走化性に対する９００ＭＨzRFの影響] [med./bio.]
  IEEE Trans Biomed Eng 55 (2): 795-797
• 2008, McIntosh RL, Iskra S, McKenzie RJ, Chambers J, Metzenthen B, Anderson V
  [携帯電話型ばく露の際の人工内耳システム近くのSARと熱変化の評価] [tech./dosim.]
  Bioelectromagnetics 29 (1): 71-80
• 2007, Drobakhin OO, Likholat YuV, Magro VI, Ryabchiy VD, Kudrjavtseva VE, Tatarchuk OM, Pokataev VN
  Influence of Electromagnetic Radiation on the Seeds of Technical Plants and the Blood of Man [med./bio.]
  2007 International Kharkov Symposium Physics and Engineering of Millimeter and Sub-Millimeter Waves (MSMW), Kharkov, Ukraine. IEEE: pp. 879-881
• 2007, Kamal A
  Heart rate variability analysis before and during exposing to low pulsed microwaves in mammals [med./bio.]
  2007 IEEE 33rd Annual Northeast Bioengineering Conference, Stony Brook, NY, USA. IEEE: pp. 126-127; ISBN 978-1-4244-1033-0
• 2007, Ren DQ, Yang WQ, Zhao T, Li XJ, Zeng GY, Zhang J, Li YR
  Changes of microwave radiation on the level of trace elements in mice bone tissues [med./bio.]
  2007 International Symposium on Electromagnetic Compatibility, Qingdao, China. IEEE: pp. 479-481; ISBN 978-1-4244-1372-0
• 2007, Drobakhin OO, Magro VI, Kudrjavtseva VE, Tatarchuk OM
  Influence of microwave irradiation on the blood of men [med./bio.]
  2007 6th International Conference on Antenna Theory and Techniques, Sevastopol, Ukraine. IEEE: pp. 315-316; ISBN 978-1-4244-1584-7