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Martínez-Sande JL, Rodríguez-Mañero M, García-Seara J, Lago M, González-Melchor L, Kreidieh B, Iacopino S, De Regibus V, De Greef Y, Bruno S, Curnis A, Sieira J, Chierchia GB, Brugada P, González-Juanatey JR, de Asmundis C
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 331-335; ISBN 978-1-5090-3955-5