著者:
Fukui S, Maeda N, Xiao F, Kami Y
掲載誌: 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE, 2018: pp. 331-335; ISBN 978-1-5090-3955-5
