キーワード:
probability, Irrtumswahrscheinlichkeit, Wahrscheinlichkeit, 確率
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2024,
Legros A, Nissi J, Laakso I, Duprez J, Kavet R, Modolo J
Brain Stimul 17 (3): 668-675
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2024,
Fan C, Sun J, Chen X, Luo W
J Cogn Neurosci 36 (9): 1864-1878
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2024,
Qin Y, Kishk MA, Elzanaty A, Chiaraviglio L, Alouini MS
IEEE Open J Commun Soc 5: 2991-3006
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2024,
Mayrose A, Haviv E, Hatzofe O, Troupin D, Elroy M, Sapir N
Condor 126 (2): duae004
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2024,
Vinod P, Thatikonda NS, Malo PK, Bhaskarapillai B, Arumugham SS, Janardhan Reddy YC
Asian J Psychiatr 94: 103962
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2024,
Han C, Tang J, Tang B, Han T, Pan J, Wang N
Medicine 103 (2): e36880
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2024,
Chen Y, Yu Q, Zheng Y, Wang T, Chi Y
IEEE Transactions on Vehicular Technology [in press]
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Neurol Sci 45 (5): 1953-1967
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2024,
Poljak D, Šušnjara A
Deterministic and Stochastic Modeling in Computational Electromagnetics: Integral and Differential Equation Approaches. IEEE: pp. 433-457; ISBN 978-1-119-98925-7
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2024,
Poljak D, Šušnjara A
Deterministic and Stochastic Modeling in Computational Electromagnetics: Integral and Differential Equation Approaches. IEEE: pp. 407-432; ISBN 978-1-119-98925-7
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2024,
Poljak D, Šušnjara A
Deterministic and Stochastic Modeling in Computational Electromagnetics: Integral and Differential Equation Approaches. IEEE: pp. 459-502; ISBN 978-1-119-98925-7
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2023,
Lin WJ, Shi WP, Ge WY, Chen LL, Guo WH, Shang P, Yin DC
Research 6: 0146
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2023,
Knenicky M, Svancar M, Spurny P
23rd International Symposium on High Voltage Engineering (ISH 2023), Glasgow, UK. IET: pp. 169-176; ISBN 978-1-83953-992-3
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2023 4th IEEE Global Conference for Advancement in Technology (GCAT), Bangalore, India. IEEE: pp. 1-6; ISBN 9798350305265
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2023,
Vitturi BK, Montecucco A, Rahmani A, Dini G, Durando P
Front Public Health 11: 1285103
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2023,
Miclaus S, Deaconescu DB, Vatamanu D, Buda AM
Technologies 11 (5): 113
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2023,
Li Q, Ba T, Cao SJ, Chen Q, Zhou B, Yan ZQ, Hou ZH, Wang LF
Chin J Burns Wounds 39 (8): 738-745
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2023,
Sun M, Chen K, He Y, Zhang Y, Zhuo Y, Zhuang H
Medicine 102 (43): e35504
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2023,
Yang SS, Zhao YY, Luo ZJ, He C, Li YH
Chin J Burns Wounds 39 (10): 968-976
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2023,
Bonato M, Tognola G, Benini M, Gallucci S, Chiaramello E, Fiocchi S, Parazzini M
IEEE Access 11: 94962-94973
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2023,
Wang B, Peterchev AV, Goetz SM
J Neural Eng 20 (5): 056002
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2023,
Tognola G, Benini M, Bonato M, Gallucci S, Parazzini M
Sensors 23 (15): 6802
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2023,
Šušnjara A, Poljak D, Galić M
2023 8th International Conference on Smart and Sustainable Technologies (SpliTech), Split/Bol, Croatia. IEEE: pp. 1-6; ISBN 9798350323207
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2023,
Ding W, Zhao X, Wang H, Wang Y, Liu Y, Gong L, Lin S, Liu C, Li Y
Int J Mol Sci 24 (12): 10271
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2023,
Shikhantsov S, Thielens A, Vermeeren G, Demeester P, Martens L, Joseph W
IEEE Trans Electromagn Compat 65 (4): 960-971
