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9443件の論文が見つかりました。

キーワード: power, Leistung, 仕事率

• 2006, Koziak AM, Desjardins D, Keenliside LD, Thomas AW, Prato FS
  [磁気遮蔽の痛覚刺激効果を光は変化させる] [med./bio.]
  Bioelectromagnetics 27 (1): 10-15
• 2006, Mezei G, Bracken TD, Senior R, Kavet R
  [磁界のピークばく露指標の解析] [tech./dosim.]
  J Expo Sci Environ Epidemiol 16 (6): 477-485
• 2006, Simko M, Hartwig C, Lantow M, Lupke M, Mattsson MO, Rahman Q, Rollwitz J
  [詳細] [ヒトMono Mac 6細胞での非熱的レベル無線周波電磁界および超微粒子へのばく露の後のHsp70発現およびフリーラジカル放出] [med./bio.]
  Toxicol Lett 161 (1): 73-82
• 2005, Stuchly MA
  Electric Fields in the Human Body at Power-Line Frequencies [tech./dosim.]
  16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 1-4; ISBN 978-1-5090-3198-6
• 2005, Ibrahiem A, Dale C, Tabbara W, Wiart J
  Analysis of the temperature increase linked to the power induced by RF source [tech./dosim.]
  Prog Electromagn Res 52: 23-46
• 2005, Lee AK, Choi HD, Choi JI, Pack JK
  The scaled SAM models and SAR for handset exposure at 835 MHz [tech./dosim.]
  IEEE MTT-S International Microwave Symposium Digest, 2005, Long Beach, CA, USA. IEEE: pp. 1323-1326; ISBN 978-0-7803-8845-1
• 2005, Afzal I, Noor MA, Bakhtavar MA, Ahmad A, Haq Z
  Improvement of spring maize (Zea mays) performance through physical and physiological seed enhancements [med./bio.]
  Seed Sci Technol 43 (2): 238-249
• 2005, Zamanian A, Hardiman C
  Electromagnetic Radiation and Human Health: A Review of Sources and Effects [basics]
  High Frequency Electronics 4 (7): 16-26
• 2005, Zhadobov M, Sauleau R, Le Coq L, Thouroude D, Orlov I, Michel D, Le Drean Y
  [60GHz電磁界はストレス反応性遺伝子の発現を活性化しない] [med./bio.]
  1th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005], St. Malo. IEEE; ISBN 978-0-9738425-0-0
• 2005, Zhadobov M, Vié V, Sauleau R, Himdi M, Le Coq L, Artzner F, Orlov I, Thouroude D
  [ミリ波と人工生体膜との相互作用] [med./bio.]
  1th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005], St. Malo. IEEE; ISBN 978-0-9738425-0-0