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7836件の論文が見つかりました。

キーワード: Migration, 移動

• 2004, Tahvanainen K, Nino J, Halonen P, Kuusela T, Laitinen T, Lansimies E, Hartikainen J, Hietanen M, Lindholm H
  [詳細] [携帯電話使用によるヒトの血圧、心拍への急性効果はない] [med./bio.]
  Bioelectromagnetics 25 (2): 73-83
• 2004, Hamblin DL, Wood AW, Croft RJ, Stough C
  [詳細] [ヒトでの聴覚課題遂行中の事象関連電位および成績に対するGSM携帯電話電磁界の影響の検査] [med./bio.]
  Clin Neurophysiol 115 (1): 171-178
• 2004, Jokela K, Puranen L, Sihvonen AP
  [デジタル式携帯電話のバッテリーからの電流による磁界ばく露評価] [tech./dosim.]
  Health Phys 86 (1): 56-66
• 2004, Celik O, Hascalik S
  [詳細] [胎児の心拍パターンに対する携帯電話放射電磁界の影響] [med./bio.]
  Eur J Obstet Gynecol Reprod Biol 112 (1): 55-56
• 2004, Krause CM, Haarala C, Sillanmaki L, Koivisto M, Alanko K, Revonsuo A, Laine M, Hämäläinen H
  [詳細] [聴覚記憶タスク時のEEGに対する携帯電話放射電磁界効果：二重ブラインド法再現研究] [med./bio.]
  Bioelectromagnetics 25 (1): 33-40
• 2004, Schönborn F, Pokovic K, Kuster N
  [1.62 GHzでのラットばく露用のカルーソル使用のドジメトリー] [tech./dosim.]
  Bioelectromagnetics 25 (1): 16-26
• 2003, Zaridze R, Tavzarashvili K, Ghvedashvili G, Kakulia D, Saparishvili G, Bijamov A
  The Method of Auxilary Sources for Numerical Modeling of EMC/EMI in Vehicles and Specific Absorption Rate Problems [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 471-474; ISBN 978-1-5090-3197-9
• 2003, Ryser H
  Measuring Campaign for the Assessment of the Non-Ionising Radiation near GSM Base Stations [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 171-174; ISBN 978-1-5090-3197-9
• 2003, Kramer A, Nikoloski N, Kuster N
  Analysis of Indoor RF-Field Distribution [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 305-306; ISBN 978-1-5090-3197-9
• 2003, Loader BG, Alexander MJ, Liang W, Torihata S
  An Optical Electric Field Probe for Specific Absorption Rate Measurements [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 57-60; ISBN 978-1-5090-3197-9