著者:
Zaridze R, Tavzarashvili K, Ghvedashvili G, Kakulia D, Saparishvili G, Bijamov A
掲載誌: 15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE, 2003: pp. 471-474; ISBN 978-1-5090-3197-9
