-
Panagopoulos DJ (ed.): CRC Press, Boca Raton; ISBN 978-1-032-06175-7
-
2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Yekaterinburg, Russian Federation. IEEE: 500-503; ISBN 978-1-6654-6481-9
-
2022,
Miura N, Kodera S, Higashiyama J, Iyama T, Suzuki Y, Hirata A
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: 423-425; ISBN 978-1-6654-5108-6
-
2022,
Gallucci S, Bonato M, Benini M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M
Sensors 23 (1): 104
-
2022,
Arduino A, Baruffaldi F, Bottauscio O, Chiampi M, Martinez JA, Zanovello U, Zilberti L
Phys Med Biol 67 (24): 245022
-
2022,
Vilagosh Z, Appadoo D, Perera PGT, Nguyen THP, Linklater D, Juodkazis S, Croft R, Ivanova E
2022 7th International Conference on Intelligent Informatics and Biomedical Science (ICIIBMS), Nara, Japan. IEEE: 367-369; ISBN 978-1-6654-8230-1
-
2022,
Laissaoui AM, Mezouad S, Nekhoul B
2022 2nd International Conference on Advanced Electrical Engineering (ICAEE), Constantine, Algeria. IEEE: 1-6; ISBN 978-1-6654-1742-6
-
2022,
Dolciotti N, Colella M, D'Agostino S, Apollonio F, Liberti M
2022 52nd European Microwave Conference (EuMC), Milan, Italy. IEEE: 476-479; ISBN 978-1-6654-5881-8
-
2022,
Stroka S, Haussmann N, Zang M, Schmuelling B, Clemens M
2022 IEEE 20th Biennial Conference on Electromagnetic Field Computation (CEFC), Denver, CO, USA. IEEE: 1-2; ISBN 978-1-6654-6834-3
-
2022,
Foroughimehr N, Vilagosh Z, Yavari A, Wood A
Sensors 22 (21): 8261