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1426件の論文が見つかりました。

キーワード: Sonde, probe, プローブ

• 2004, Kawai H, Ito K
  [局所平均SAR予測の単純な評価法] [tech./dosim.]
  IEEE Trans Microw Theory Tech 52 (8): 2021-2029
• 2004, Zmyslony M, Politanski P, Rajkowska E, Szymczak W, Jajte J
  [詳細] [鉄イオン処理したラットリンパ球の活性酸素種に対する930 MHz CW電磁照射の急性ばく露の影響] [med./bio.]
  Bioelectromagnetics 25 (5): 324-328
• 2004, Nuutinen J, Ikaheimo R, Lahtinen T
  [皮膚および皮下脂肪内の組織液の変化を評価するための新たな誘電装置の検証] [tech./dosim.]
  Physiol Meas 25 (2): 447-454
• 2004, Curcio G, Ferrara M, De Gennaro L, Cristiani R, D'Inzeo G, Bertini M
  [詳細] [電磁界の時間はヒトの行動と鼓膜温に影響する] [med./bio.]
  NeuroReport 15 (1): 161-164
• 2004, Schönborn F, Pokovic K, Kuster N
  [1.62 GHzでのラットばく露用のカルーソル使用のドジメトリー] [tech./dosim.]
  Bioelectromagnetics 25 (1): 16-26
• 2004, Marinelli F, La Sala D, Cicciotti G, Cattini L, Trimarchi C, Putti S, Zamparelli A, Giuliani L, Tomassetti G, Cinti C
  [詳細] [900 MHzの電磁界のT-リンパ芽球性白血病CCRF-CEM細胞へのばく露は、プロアポトーシスと生存促進シグナル間のアンバランスを誘発する] [med./bio.]
  J Cell Physiol 198 (2): 324-332
• 2003, Kramer A, Nikoloski N, Kuster N
  Analysis of Indoor RF-Field Distribution [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 305-306; ISBN 978-1-5090-3197-9
• 2003, Loader BG, Alexander MJ, Liang W, Torihata S
  An Optical Electric Field Probe for Specific Absorption Rate Measurements [tech./dosim.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 57-60; ISBN 978-1-5090-3197-9
• 2003, Lehmann H, Urech M, Pickl C
  Tradescantia Micronucleus Bioassay for Detecting Mutagenicity of GSM-Fields [med./bio.]
  15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 301-304; ISBN 978-1-5090-3197-9
• 2003, Inaoka H, Takahuda K, Saito H
  Development of a new microwave heating method for bone tumors [tech./dosim.]
  IEEE EMBS Asian-Pacific Conference on Biomedical Engineering, 2003, Kyoto, Japan. IEEE: pp. 354-355; ISBN 978-0-7803-7943-5