-
2024,
Qahtan Wali S, Sali A, Suka D, Aerts S, Alkuraysi M, Li L, Ismail A, Hashim F, Alsaidosh YA, Gil Jimenez VP, Ruttner M, Faizd Osman A
IEEE Access 12: 130639-130653
-
2024,
Liu S, Onishi T, Taki M, Watanabe S
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 995-996; ISBN 9798350369915
-
2024,
Cao M, Liu Z, Xiao R, Wiart J
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 999-1000; ISBN 9798350369915
-
2024,
Shamsul Kamal AM, Mohd Isa FN, Abdul Malekl NF, Mohamad SY
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 2711-2712; ISBN 9798350369915
-
2024,
Butković I, Vince S, Lojkić M, Folnožić I, Tur SM, Vilić M, Malarić K, Berta V, Samardžija M, Kreszinger M, Žaja IŽ
Theriogenology 230: 243-249
-
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 2461-2462; ISBN 9798350369915
-
2024,
Ali MZ, Kabonzo FM, Nedil M, Benmabrouk I, Al Hasan M
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 1227-1228; ISBN 9798350369915
-
2024,
Ali U, Basir A, Khan MWA, Pournoori N, Sydänheimo L, Ukkonen L, Björninen T
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 1765-1766; ISBN 9798350369915
-
2024,
Roper CJ, Ma C, Hagness SC
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 2515-2516; ISBN 9798350369915
-
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy. IEEE: pp. 2269-2270; ISBN 9798350369915