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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 186-189; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 638-641; ISBN 978-4-88552-287-1
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Kang WG, Alexander Z, Jun HY, Park YH, Pack JK
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 198-201; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 529-532; ISBN 978-4-88552-287-1
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Higashiyama J, Tarusawa Y
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 650-653; ISBN 978-4-88552-287-1