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2006,
Villarini M, Moretti M, Scassellati-Sforzolini G, Boccioli B, Pasquini R
Sci Total Environ 361 (1-3): 208-219
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2005,
Brooks DR, Nicol S, Wojcik J
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 97-102; ISBN 978-1-5090-3198-6
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2005,
Okano Y, Sugama Y, Abe M
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 161-166; ISBN 978-1-5090-3198-6
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2005,
Roux D, Vian A, Goupil P, Ledoigt G, Girard S, Paladian F, Bonnet P
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 141-144; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 145-150; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 5-8; ISBN 978-1-5090-3198-6
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2005,
Anzaldi G, Delgado EC, Riu PJ, Silva F
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 155-160; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 1-4; ISBN 978-1-5090-3198-6
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2005,
Bitz A, El Ouardi A, Streckert J, Hansen V
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 115-118; ISBN 978-1-5090-3198-6
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2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 111-114; ISBN 978-1-5090-3198-6