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2012,
Spathmann O, Hansen V, Streckert J, Zhou Y, Clemens M, Grote K, Klose M, Lerchl A
International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, 2012. IEEE: p. 13225800; ISBN 978-1-4673-0717-8
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WSEAS Transactions on Circuits and Systems 11 (1): 1-10
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2012,
Leitgeb N, Niedermayr F, Fuchs C
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[LTE端末のSAR値分析]
[tech./dosim.]
International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, 2012. IEEE: pp. 1-4; ISBN 978-1-4673-0717-8