キーワード:
電磁両立性, "elektromagnetische Verträglichkeit", EMC, EMV, "electromagnetic compatibility"
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2006,
Fernandez-Chimeno M, Quilez M, Silva F
IEEE Trans Biomed Eng 53 (6): 1206-1209
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Telemed J E Health 12 (3): 373-382
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2006,
Sorri MJ, Piiparinen PJ, Huttunen KH, Haho MJ
IEEE Trans Neural Syst Rehabil Eng 14 (1): 101-108
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Health Estate 60 (1): 37-8, 40-2
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2005,
Brooks DR, Nicol S, Wojcik J
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 97-102; ISBN 978-1-5090-3198-6
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2005,
Okano Y, Sugama Y, Abe M
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 161-166; ISBN 978-1-5090-3198-6
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2005,
Roux D, Vian A, Goupil P, Ledoigt G, Girard S, Paladian F, Bonnet P
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 141-144; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 145-150; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 5-8; ISBN 978-1-5090-3198-6
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2005,
Anzaldi G, Delgado EC, Riu PJ, Silva F
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 155-160; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 1-4; ISBN 978-1-5090-3198-6
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2005,
Bitz A, El Ouardi A, Streckert J, Hansen V
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 115-118; ISBN 978-1-5090-3198-6
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2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 111-114; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 123-126; ISBN 978-1-5090-3198-6
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2005,
Nyenhuis JA, Amjad A, Kamondetdacha R, Park SM
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 13-16; ISBN 978-1-5090-3198-6
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2005,
Francavilla M, Schiavoni A
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 107-110; ISBN 978-1-5090-3198-6
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2005,
Merla C, Liberti M, Orlando AR, Apollonio F, D'Inzeo G
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 89-92; ISBN 978-1-5090-3198-6
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2005,
Wu D, Qiang R, Chen J, Kainz W, Seidman S
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005, Chicago, IL, USA. 3巻; IEEE: pp. 796-800; ISBN 978-0-7803-9380-6
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IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology, 2005, St. Petersburg, Russia. IEEE: pp. 9-14; ISBN 978-0-7803-9374-5
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2005,
Shizeng W, Zhaojin C, Changzhe W, Jing Y
2005 IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, Beijing, China. 1巻; IEEE: pp. 605-609; ISBN 978-0-7803-9128-4
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2005,
Giliberti C, Bedini A, Palomba R, D'Emilia E, Magli CV, Giuliani L
IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology, 2005, St. Petersburg, Russia. IEEE: pp. 208-212; ISBN 978-0-7803-9374-5
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2005,
Tarusawa Y, Ohshita K, Suzuki Y, Nojima T, Toyoshima T
IEEE Trans Electromagn Compat 47 (4): 938-950
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2005,
Jianqing W, Fujiwara O, Uda T
IEEE Trans Electromagn Compat 47 (4): 971-976
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2005,
Joseph W, Martens L
IEEE Trans Electromagn Compat 47 (4): 977-985
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2005,
Abd-Alhameed RA, Excell PS, Mangoud MA
IEEE Trans Electromagn Compat 47 (2): 374-381