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2173件の論文が見つかりました。

キーワード: 閾値, Schwellenwert, "threshold value", threshold

• 2023, Conde-Antón Á, Hernando-Garijo I, Jiménez-Del-Barrio S, Mingo-Gómez MT, Medrano-de-la-Fuente R, Ceballos-Laita L
  [線維筋痛症患者における経頭蓋直流刺激および経頭蓋磁気刺激の効果：系統的レビュー] [foreign-language]
  Neurologia 38 (6): 427-439
• 2022, Du D, Li J, Xu S, Guo J, He W, Lin J
  [Design and dose characteristics of 1-6 GHz radio frequency exposure platform] [foreign-language]
  J Radiat Proc 40 (4): 66-72
• 2022, Zhao X, Lu M
  [Safety assessment of electromagnetic exposure for wireless charging of cardiac pacemakers] [foreign-language]
  J Radiat Proc 40 (2): 42-53
• 2022, Chang YC, Ahmed U, Jayaprakash N, Mughrabi I, Lin Q, Wu YC, Gerber M, Abbas A, Daytz A, Gabalski AH, Ashville J, Dokos S, Rieth L, Datta-Chaudhuri T, Tracey KJ, Guo T, Al-Abed Y, Zanos S
  kHz-frequency electrical stimulation selectively activates small, unmyelinated vagus afferents [med./bio.]
  Brain Stimul 15 (6): 1389-1404
• 2022, Guo F, Qian K, Li X, Deng H
  Simulation study of cell transmembrane potential and electroporation induced by time-varying magnetic fields [tech./dosim.]
  Innovative Food Sci Emerging Technol 81: 103117
• 2022, Gordon LB, Liechty J, Bradley J, Merrill L, Gauss H
  Electric Shock Hazards Beyond 50/60 HZ and DC [review]
  2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-8; ISBN 978-1-6654-7864-9
• 2022, Antczak JM, Dębowska W, Poleszczyk A, Kaźmierski J, Rymaszewska J, Waszkiewicz N, Wichniak A
  [患者選択の原則と反復的経頭蓋磁気刺激の安全性 - ポーランド精神医学会生物学的精神医学部門の見解表明] [basics]
  Psychiatr Pol 56 (6): 1165-1184
• 2022, Koseki T, Kudo D, Yoshida K, Nito M, Takano K, Jin M, Tanabe S, Sato T, Katoh H, Yamaguchi T
  [神経筋電気刺激と経皮脊髄直流刺激の併用は健康なヒトの運動皮質の可塑性を高める] [med./bio.]
  Front Neurosci 16: 1034451
• 2022, Sharma D, Chauhan A, Thakur S
  [若年成人の聴覚に対する携帯電話使用の影響：観察研究] [epidem.]
  Indian J Otolaryngol Head Neck Surg 74 Suppl 3: 3754-3757
• 2022, Ma F, Liu X, Ansari N
  [IoTにおける遠方界ワイヤレス電力伝送についての電磁放射安全性] [tech./dosim.]
  GLOBECOM 2022 - 2022 IEEE Global Communications Conference, Rio de Janeiro, Brazil. IEEE: pp. 4995-5000; ISBN 978-1-6654-3541-3