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4779件の論文が見つかりました。

キーワード: 被験者, Versuchsperson, Testperson, Proband, "test person", subject

• 1999, Hardell L, Nasman A, Pahlson A, Hallquist A, Hansson Mild K
  [詳細] [携帯電話使用と脳腫瘍のリスク：症例対照研究] [epidem.]
  Int J Oncol 15 (1): 113-116
• 1999, Borbely AA, Huber R, Graf T, Fuchs B, Gallmann E, Achermann P
  [詳細] [パルス高周波電磁界は人の睡眠と睡眠脳電図を変化させる] [med./bio.]
  Neurosci Lett 275 (3): 207-210
• 1999, Sidorenko AV
  [詳細] [マイクロ波又はストリキニーネによる動物の脳活動解析] [tech./dosim.]
  Bioelectrochem Bioenerg 48 (1): 223-226
• 1999, Graham C, Cook MR
  [60 Hz磁界ばく露下でのヒトの睡眠] [med./bio.]
  Bioelectromagnetics 20 (5): 277-283
• 1999, Preece AW, Iwi G, Davies-Smith A, Wesnes K, Butler S, Lim E, Varey A
  [詳細] [ヒトの認知機能に対する915 MHz携帯電話シグナルの影響] [med./bio.]
  Int J Radiat Biol 75 (4): 447-456
• 1998, Guimarães CAC, Garcia RO, Raizer A
  Studies of Electromagnetic Interference from Electrosurgical Units [temp.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 689-694; ISBN 9798331500016
• 1998, Bernardi P, Cavagnaro M, Pisa S, Piuzzi E
  Evaluation of SAR and Temperature Distribution in Subjects Exposed in the Far-Field of Radiating Radio Frequency Sources [tech./dosim.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 190-193; ISBN 9798331500016
• 1998, Yamashita M, Osaki K, Shimizu K
  Effects of a Strong ELF Electric Field on the Human Electroencephalogram [temp.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 159-164; ISBN 9798331500016
• 1998
  Advances in Computational Electrodynamics: The Finite-Difference Time-Domain Method [basics]
  Taflove A (ed.): Artech House, Boston, MA, USA; ISBN 978-0-89006-834-2
• 1998, Adair ER, Kelleher SA, Cobb BL, Mylacraine KS
  Physiological thermoregulatory responses of human volunteers exposed at two radio frequencies (450 and 2450 MHz) [med./bio.]
  Proceedings of the 20th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Vol.20 Biomedical Engineering Towards the Year 2000 and Beyond (Cat. No.98CH36286), Hong Kong, China. 6巻; IEEE: pp. 3245-3248; ISBN 978-0-7803-5164-6